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Complex plane analysis in electrode modulated specular reflectance studies
(AIP Publishing, 1973)
Optical specular reflection is finding extensive use for studies of electrode-electrolyte interfaces. The purpose of this Note is to call attention to the use of complex plane analysis to obtain kinetic information concerning ...
Reflectance study of cation adsorption on oxide layers of gold and platinum electrodes
(Elsevier Sequoia S.A., Lausanne, 1979)
Static characteristics of metal-insulator-semiconductor-insulator-metal (MISIM) structures-I. Electric field and potential distributions
(Elsevier, 1975)
The static characteristics (potential and electric field distributions) of sandwich structures of a metal 1-insulator 1-nondegenerated semiconductor-insulator 2-metal 2 (M1I1S I2M2)-type are analyzed. A theory is given ...
Static characteristics of the metal-insulator-semiconductor- insulator-metal (MISIM) structure—II. Low frequency capacitance
(Elsevier, 1975)
It is shown that the reciprocal value of low frequency capacitance of a MISIM structure can be represented by a sum of reciprocal values of insulator layer and surface space charge capacitances and an “interaction” term ...
Influence of carriers on the capacitance of p-n junctions with deep donors
(Elsevier, 1974)
Applying the definition of p-n junction capacitance [1], which takes into account the effect of carriers in the space-charge region, a sufficiently accurate approximate expression is derived for the low-frequency capacitance ...