A consideration of transparent metal structures for subwavelength diffraction management
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2006
Authors
Jakšić, ZoranSarajlić, Milija
Maksimović, Milan
Vasiljević-Radović, Dana
Jovanović, Dušan M.
Conference object (Published version)
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We considered theoretically and experimentally one-dimensional multilayered metallodielectric nanofilms with nanometric thickness for imaging below the diffraction limit. We investigated their behavior in the ultravioled and visible spectrum from the point of view of near field optics, but also considered some of their properties in the far field. We designed our structures using the transfer matrix method and utilized RF sputtering to fabricate them. We consider some possible approaches to extract optical information from such multilavers.
Keywords:
metamaterials / nanostructured materials / Optical imaging / Optical sensorsSource:
25th International Conference on Microelectronics, MIEL 2006 - Proceedings, 2006, 153-Publisher:
- Institute of Electrical and Electronics Engineers Inc.
Funding / projects:
- TR6151 - Micro and Nanosystem Technologies, Structures and Sensors
DOI: 10.1109/ICMEL.2006.1650917
ISBN: 1-4244-0117-8
ISSN: 2159-1660
WoS: 000238839700027
Scopus: 2-s2.0-77956531445
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Institution/Community
IHTMTY - CONF AU - Jakšić, Zoran AU - Sarajlić, Milija AU - Maksimović, Milan AU - Vasiljević-Radović, Dana AU - Jovanović, Dušan M. PY - 2006 UR - https://cer.ihtm.bg.ac.rs/handle/123456789/243 AB - We considered theoretically and experimentally one-dimensional multilayered metallodielectric nanofilms with nanometric thickness for imaging below the diffraction limit. We investigated their behavior in the ultravioled and visible spectrum from the point of view of near field optics, but also considered some of their properties in the far field. We designed our structures using the transfer matrix method and utilized RF sputtering to fabricate them. We consider some possible approaches to extract optical information from such multilavers. PB - Institute of Electrical and Electronics Engineers Inc. C3 - 25th International Conference on Microelectronics, MIEL 2006 - Proceedings T1 - A consideration of transparent metal structures for subwavelength diffraction management SP - 153 DO - 10.1109/ICMEL.2006.1650917 ER -
@conference{ author = "Jakšić, Zoran and Sarajlić, Milija and Maksimović, Milan and Vasiljević-Radović, Dana and Jovanović, Dušan M.", year = "2006", abstract = "We considered theoretically and experimentally one-dimensional multilayered metallodielectric nanofilms with nanometric thickness for imaging below the diffraction limit. We investigated their behavior in the ultravioled and visible spectrum from the point of view of near field optics, but also considered some of their properties in the far field. We designed our structures using the transfer matrix method and utilized RF sputtering to fabricate them. We consider some possible approaches to extract optical information from such multilavers.", publisher = "Institute of Electrical and Electronics Engineers Inc.", journal = "25th International Conference on Microelectronics, MIEL 2006 - Proceedings", title = "A consideration of transparent metal structures for subwavelength diffraction management", pages = "153", doi = "10.1109/ICMEL.2006.1650917" }
Jakšić, Z., Sarajlić, M., Maksimović, M., Vasiljević-Radović, D.,& Jovanović, D. M.. (2006). A consideration of transparent metal structures for subwavelength diffraction management. in 25th International Conference on Microelectronics, MIEL 2006 - Proceedings Institute of Electrical and Electronics Engineers Inc.., 153. https://doi.org/10.1109/ICMEL.2006.1650917
Jakšić Z, Sarajlić M, Maksimović M, Vasiljević-Radović D, Jovanović DM. A consideration of transparent metal structures for subwavelength diffraction management. in 25th International Conference on Microelectronics, MIEL 2006 - Proceedings. 2006;:153. doi:10.1109/ICMEL.2006.1650917 .
Jakšić, Zoran, Sarajlić, Milija, Maksimović, Milan, Vasiljević-Radović, Dana, Jovanović, Dušan M., "A consideration of transparent metal structures for subwavelength diffraction management" in 25th International Conference on Microelectronics, MIEL 2006 - Proceedings (2006):153, https://doi.org/10.1109/ICMEL.2006.1650917 . .