Photo-pyro-piezo-electric elastic bending method: Investigation of metalsemiconductor structure
Samo za registrovane korisnike
2002
Autori
Todorović, D. M.Nikolić, P.M.
Smiljanić, Miloljub
Bojičić, A.I.
Vasiljević-Radović, Dana
Radulović, Katarina
Konferencijski prilog (Objavljena verzija)
Metapodaci
Prikaz svih podataka o dokumentuApstrakt
The metal-semiconductor (MS) junction is investigated by new method based on two techniques: the acphotovoltage and pyro-piezo-electric technique. The sample with metal-semiconductor-metal configuration was attached to the pyro(piezo)electric detector and ac-voltages can be measured. The photovoltage and pyro-piezo-electric effects are investigated as a function of the modulation frequency of excitation optical beam. A theoretical model for a metal - semiconductor - metal - pyro(piezo)electric system is given including the space-charge regions (SCR) and electronic states on the semiconductor surfaces, and thermodifussion, thermoelastic and electronic deformation effects in semiconductor.
Ključne reči:
Optical surface waves / Thermoelasticity / Schottky barriers / Detectors / Optical beams / Inorganic materials / Semiconductor materials / Charge carriersIzvor:
23rd International Conference on Microelectronics, MIEL 2002 - Proceedings, 2002, 1, 231-234Izdavač:
- IEEE Computer Society
Institucija/grupa
IHTMTY - CONF AU - Todorović, D. M. AU - Nikolić, P.M. AU - Smiljanić, Miloljub AU - Bojičić, A.I. AU - Vasiljević-Radović, Dana AU - Radulović, Katarina PY - 2002 UR - https://cer.ihtm.bg.ac.rs/handle/123456789/84 AB - The metal-semiconductor (MS) junction is investigated by new method based on two techniques: the acphotovoltage and pyro-piezo-electric technique. The sample with metal-semiconductor-metal configuration was attached to the pyro(piezo)electric detector and ac-voltages can be measured. The photovoltage and pyro-piezo-electric effects are investigated as a function of the modulation frequency of excitation optical beam. A theoretical model for a metal - semiconductor - metal - pyro(piezo)electric system is given including the space-charge regions (SCR) and electronic states on the semiconductor surfaces, and thermodifussion, thermoelastic and electronic deformation effects in semiconductor. PB - IEEE Computer Society C3 - 23rd International Conference on Microelectronics, MIEL 2002 - Proceedings T1 - Photo-pyro-piezo-electric elastic bending method: Investigation of metalsemiconductor structure VL - 1 SP - 231 EP - 234 DO - 10.1109/MIEL.2002.1003182 ER -
@conference{ author = "Todorović, D. M. and Nikolić, P.M. and Smiljanić, Miloljub and Bojičić, A.I. and Vasiljević-Radović, Dana and Radulović, Katarina", year = "2002", abstract = "The metal-semiconductor (MS) junction is investigated by new method based on two techniques: the acphotovoltage and pyro-piezo-electric technique. The sample with metal-semiconductor-metal configuration was attached to the pyro(piezo)electric detector and ac-voltages can be measured. The photovoltage and pyro-piezo-electric effects are investigated as a function of the modulation frequency of excitation optical beam. A theoretical model for a metal - semiconductor - metal - pyro(piezo)electric system is given including the space-charge regions (SCR) and electronic states on the semiconductor surfaces, and thermodifussion, thermoelastic and electronic deformation effects in semiconductor.", publisher = "IEEE Computer Society", journal = "23rd International Conference on Microelectronics, MIEL 2002 - Proceedings", title = "Photo-pyro-piezo-electric elastic bending method: Investigation of metalsemiconductor structure", volume = "1", pages = "231-234", doi = "10.1109/MIEL.2002.1003182" }
Todorović, D. M., Nikolić, P.M., Smiljanić, M., Bojičić, A.I., Vasiljević-Radović, D.,& Radulović, K.. (2002). Photo-pyro-piezo-electric elastic bending method: Investigation of metalsemiconductor structure. in 23rd International Conference on Microelectronics, MIEL 2002 - Proceedings IEEE Computer Society., 1, 231-234. https://doi.org/10.1109/MIEL.2002.1003182
Todorović DM, Nikolić P, Smiljanić M, Bojičić A, Vasiljević-Radović D, Radulović K. Photo-pyro-piezo-electric elastic bending method: Investigation of metalsemiconductor structure. in 23rd International Conference on Microelectronics, MIEL 2002 - Proceedings. 2002;1:231-234. doi:10.1109/MIEL.2002.1003182 .
Todorović, D. M., Nikolić, P.M., Smiljanić, Miloljub, Bojičić, A.I., Vasiljević-Radović, Dana, Radulović, Katarina, "Photo-pyro-piezo-electric elastic bending method: Investigation of metalsemiconductor structure" in 23rd International Conference on Microelectronics, MIEL 2002 - Proceedings, 1 (2002):231-234, https://doi.org/10.1109/MIEL.2002.1003182 . .