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dc.creatorJakšić, Zoran
dc.creatorJakšić, Olga
dc.creatorVujanić, Aleksandar
dc.creatorĐurić, Zoran G.
dc.creatorPetrović, Radomir
dc.creatorRanđelović, Danijela
dc.date.accessioned2019-01-30T17:10:41Z
dc.date.available2019-01-30T17:10:41Z
dc.date.issued2002
dc.identifier.isbn0-7803-7235-2
dc.identifier.urihttp://cer.ihtm.bg.ac.rs/handle/123456789/85
dc.description.abstractWe analyze fabrication-induced imperfections and disorder in our photonic crystals (PC) fabricated by microsystem technologies. Based on a correspondence between holograms and photonic crystals, we introduce technological figures of merit valid for arbitrary PC structures. We use these figures of merit to analyze a practical example of a 1D PC structure. To this purpose we designed our PCs for middle-wavelength infrared range using the transfer matrix technique and fabricated them in silicon/silica using rf sputtering. We used scanning electron microscopy to determine the cross-sectional geometrical parameters of PCs and to find out their deviations from the designed values. Fourier infrared spectroscopy was used to measure spectral transmittance of the samples. The observed imperfections result in spectral transmission curves deviating from the designed characteristics, and reduce overall transmission by scattering. The presented analysis enables the prediction of attainable quality of PCs. The approach is applicable to any of 1D, 2D or 3D photonic crystals.en
dc.publisherIEEE Computer Society
dc.rightsrestrictedAccess
dc.source23rd International Conference on Microelectronics, MIEL 2002 - Proceedings
dc.subjectPhotonic crystals
dc.subjectOptical scattering
dc.subjectPersonal communication networks
dc.subjectOptical refraction
dc.subjectOptical variables control
dc.subjectMicrowave technology
dc.titleA consideration of fabrication-induced imperfections in photonic crystals for optical frequenciesen
dc.typeconferenceObject
dc.rights.licenseARR
dcterms.abstractВујанић, A.; Јакшић, Зоран; Ђурић, Зоран Г.; Петровић, Р.; Ранђеловић, Данијела; Јак̂ић, О.;
dc.citation.volume1
dc.citation.spage293
dc.citation.epage296
dc.citation.other1: 293-296
dc.identifier.doi10.1109/MIEL.2002.1003195
dc.identifier.rcubConv_4383
dc.identifier.scopus2-s2.0-84906668655
dc.type.versionpublishedVersion


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