A consideration of fabrication-induced imperfections in photonic crystals for optical frequencies
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2002
Authors
Jakšić, Zoran
Jakšić, Olga

Vujanić, Aleksandar
Đurić, Zoran G.

Petrović, Radomir
Randjelović, Danijela

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We analyze fabrication-induced imperfections and disorder in our photonic crystals (PC) fabricated by microsystem technologies. Based on a correspondence between holograms and photonic crystals, we introduce technological figures of merit valid for arbitrary PC structures. We use these figures of merit to analyze a practical example of a 1D PC structure. To this purpose we designed our PCs for middle-wavelength infrared range using the transfer matrix technique and fabricated them in silicon/silica using rf sputtering. We used scanning electron microscopy to determine the cross-sectional geometrical parameters of PCs and to find out their deviations from the designed values. Fourier infrared spectroscopy was used to measure spectral transmittance of the samples. The observed imperfections result in spectral transmission curves deviating from the designed characteristics, and reduce overall transmission by scattering. The presented analysis enables the prediction of attainable quality o...f PCs. The approach is applicable to any of 1D, 2D or 3D photonic crystals.
Keywords:
Photonic crystals / Optical scattering / Personal communication networks / Optical refraction / Optical variables control / Microwave technologySource:
23rd International Conference on Microelectronics, MIEL 2002 - Proceedings, 2002, 1, 293-296Publisher:
- IEEE Computer Society
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IHTMTY - CONF AU - Jakšić, Zoran AU - Jakšić, Olga AU - Vujanić, Aleksandar AU - Đurić, Zoran G. AU - Petrović, Radomir AU - Randjelović, Danijela PY - 2002 UR - https://cer.ihtm.bg.ac.rs/handle/123456789/85 AB - We analyze fabrication-induced imperfections and disorder in our photonic crystals (PC) fabricated by microsystem technologies. Based on a correspondence between holograms and photonic crystals, we introduce technological figures of merit valid for arbitrary PC structures. We use these figures of merit to analyze a practical example of a 1D PC structure. To this purpose we designed our PCs for middle-wavelength infrared range using the transfer matrix technique and fabricated them in silicon/silica using rf sputtering. We used scanning electron microscopy to determine the cross-sectional geometrical parameters of PCs and to find out their deviations from the designed values. Fourier infrared spectroscopy was used to measure spectral transmittance of the samples. The observed imperfections result in spectral transmission curves deviating from the designed characteristics, and reduce overall transmission by scattering. The presented analysis enables the prediction of attainable quality of PCs. The approach is applicable to any of 1D, 2D or 3D photonic crystals. PB - IEEE Computer Society C3 - 23rd International Conference on Microelectronics, MIEL 2002 - Proceedings T1 - A consideration of fabrication-induced imperfections in photonic crystals for optical frequencies VL - 1 SP - 293 EP - 296 DO - 10.1109/MIEL.2002.1003195 ER -
@conference{ author = "Jakšić, Zoran and Jakšić, Olga and Vujanić, Aleksandar and Đurić, Zoran G. and Petrović, Radomir and Randjelović, Danijela", year = "2002", abstract = "We analyze fabrication-induced imperfections and disorder in our photonic crystals (PC) fabricated by microsystem technologies. Based on a correspondence between holograms and photonic crystals, we introduce technological figures of merit valid for arbitrary PC structures. We use these figures of merit to analyze a practical example of a 1D PC structure. To this purpose we designed our PCs for middle-wavelength infrared range using the transfer matrix technique and fabricated them in silicon/silica using rf sputtering. We used scanning electron microscopy to determine the cross-sectional geometrical parameters of PCs and to find out their deviations from the designed values. Fourier infrared spectroscopy was used to measure spectral transmittance of the samples. The observed imperfections result in spectral transmission curves deviating from the designed characteristics, and reduce overall transmission by scattering. The presented analysis enables the prediction of attainable quality of PCs. The approach is applicable to any of 1D, 2D or 3D photonic crystals.", publisher = "IEEE Computer Society", journal = "23rd International Conference on Microelectronics, MIEL 2002 - Proceedings", title = "A consideration of fabrication-induced imperfections in photonic crystals for optical frequencies", volume = "1", pages = "293-296", doi = "10.1109/MIEL.2002.1003195" }
Jakšić, Z., Jakšić, O., Vujanić, A., Đurić, Z. G., Petrović, R.,& Randjelović, D.. (2002). A consideration of fabrication-induced imperfections in photonic crystals for optical frequencies. in 23rd International Conference on Microelectronics, MIEL 2002 - Proceedings IEEE Computer Society., 1, 293-296. https://doi.org/10.1109/MIEL.2002.1003195
Jakšić Z, Jakšić O, Vujanić A, Đurić ZG, Petrović R, Randjelović D. A consideration of fabrication-induced imperfections in photonic crystals for optical frequencies. in 23rd International Conference on Microelectronics, MIEL 2002 - Proceedings. 2002;1:293-296. doi:10.1109/MIEL.2002.1003195 .
Jakšić, Zoran, Jakšić, Olga, Vujanić, Aleksandar, Đurić, Zoran G., Petrović, Radomir, Randjelović, Danijela, "A consideration of fabrication-induced imperfections in photonic crystals for optical frequencies" in 23rd International Conference on Microelectronics, MIEL 2002 - Proceedings, 1 (2002):293-296, https://doi.org/10.1109/MIEL.2002.1003195 . .