A consideration of fabrication-induced imperfections in photonic crystals for optical frequencies
Authorized Users Only
2002
Authors
Jakšić, Zoran
Jakšić, Olga

Vujanić, Aleksandar
Đurić, Zoran G.

Petrović, Radomir
Ranđelović, Danijela

Conference object (Published version)

Metadata
Show full item recordAbstract
We analyze fabrication-induced imperfections and disorder in our photonic crystals (PC) fabricated by microsystem technologies. Based on a correspondence between holograms and photonic crystals, we introduce technological figures of merit valid for arbitrary PC structures. We use these figures of merit to analyze a practical example of a 1D PC structure. To this purpose we designed our PCs for middle-wavelength infrared range using the transfer matrix technique and fabricated them in silicon/silica using rf sputtering. We used scanning electron microscopy to determine the cross-sectional geometrical parameters of PCs and to find out their deviations from the designed values. Fourier infrared spectroscopy was used to measure spectral transmittance of the samples. The observed imperfections result in spectral transmission curves deviating from the designed characteristics, and reduce overall transmission by scattering. The presented analysis enables the prediction of attainable quality o...f PCs. The approach is applicable to any of 1D, 2D or 3D photonic crystals.
Keywords:
Photonic crystals / Optical scattering / Personal communication networks / Optical refraction / Optical variables control / Microwave technologySource:
23rd International Conference on Microelectronics, MIEL 2002 - Proceedings, 2002, 1, 293-296Publisher:
- IEEE Computer Society