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dc.creatorNenadovic, Milos
dc.creatorŠtrbac, Svetlana
dc.creatorRakočević, Zlatko Lj.
dc.date.accessioned2019-01-30T17:24:55Z
dc.date.available2019-01-30T17:24:55Z
dc.date.issued2010
dc.identifier.issn0169-4332
dc.identifier.urihttp://cer.ihtm.bg.ac.rs/handle/123456789/750
dc.description.abstractIn this work, the quantitative conditions for the lift height for imaging of the magnetic field using magnetic force microscopy (MFM) were optimized. A thin cobalt film deposited on a monocrystalline silicon (1 0 0) substrate with a thickness of 55 nm and a thin nickel film deposited on a glass with a thickness of 600 nm were used as samples. The topography of the surface was acquired by tapping mode atomic force microscopy (AFM), while MFM imaging was performed in the lift mode for various lift heights. It was determined that the sensitivity of the measurements was about 10% higher for images obtained at a scan angle of 90 degrees compared to a scan angle of 0 degrees. Therefore, the three-dimensional surface texture parameters, i.e., average roughness, skewness, kurtosis and the bearing ratio, were determined in dependence on the lift height for a scan angle of 90 degrees. The results of the analyses of the surface parameters showed that the influence of the substrate and its texture on the magnetic force image could be neglected for lift heights above 40 nm and that the upper lift height limit is 100 nm. It was determined that the optimal values of the lift heights were in the range from 60 to 80 nm, depending on the nature of the sample and on the type of the tip used.en
dc.publisherElsevier Science Bv, Amsterdam
dc.relationinfo:eu-repo/grantAgreement/MESTD/MPN2006-2010/141001/RS//
dc.rightsrestrictedAccess
dc.sourceApplied Surface Science
dc.subject3D surface parametersen
dc.subjectCobalt thin filmen
dc.subjectNickel thin filmen
dc.subjectMFMen
dc.subjectLift heighten
dc.subjectMagnetic contrasten
dc.titleQuantification of the lift height for magnetic force microscopy using 3D surface parametersen
dc.typearticle
dc.rights.licenseARR
dcterms.abstractШтрбац, Светлана; Ракочевић, Златко Љ.; Ненадовиц, М.;
dc.citation.volume256
dc.citation.issue6
dc.citation.spage1652
dc.citation.epage1656
dc.citation.other256(6): 1652-1656
dc.citation.rankM22
dc.identifier.doi10.1016/j.apsusc.2009.09.088
dc.identifier.rcubConv_2477
dc.identifier.scopus2-s2.0-72649083154
dc.identifier.wos000273151900006
dc.type.versionpublishedVersion


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