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Quantification of the lift height for magnetic force microscopy using 3D surface parameters

Authorized Users Only
2010
Authors
Nenadović, Miloš
Štrbac, Svetlana
Rakočević, Zlatko Lj.
Article (Published version)
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Abstract
In this work, the quantitative conditions for the lift height for imaging of the magnetic field using magnetic force microscopy (MFM) were optimized. A thin cobalt film deposited on a monocrystalline silicon (1 0 0) substrate with a thickness of 55 nm and a thin nickel film deposited on a glass with a thickness of 600 nm were used as samples. The topography of the surface was acquired by tapping mode atomic force microscopy (AFM), while MFM imaging was performed in the lift mode for various lift heights. It was determined that the sensitivity of the measurements was about 10% higher for images obtained at a scan angle of 90 degrees compared to a scan angle of 0 degrees. Therefore, the three-dimensional surface texture parameters, i.e., average roughness, skewness, kurtosis and the bearing ratio, were determined in dependence on the lift height for a scan angle of 90 degrees. The results of the analyses of the surface parameters showed that the influence of the substrate and its texture... on the magnetic force image could be neglected for lift heights above 40 nm and that the upper lift height limit is 100 nm. It was determined that the optimal values of the lift heights were in the range from 60 to 80 nm, depending on the nature of the sample and on the type of the tip used.

Keywords:
3D surface parameters / Cobalt thin film / Nickel thin film / MFM / Lift height / Magnetic contrast
Source:
Applied Surface Science, 2010, 256, 6, 1652-1656
Publisher:
  • Elsevier
Funding / projects:
  • Dobijanje i karakterizacija površina nanostrukturnih materijala (RS-141001)

DOI: 10.1016/j.apsusc.2009.09.088

ISSN: 0169-4332

WoS: 000273151900006

Scopus: 2-s2.0-72649083154
[ Google Scholar ]
15
14
URI
https://cer.ihtm.bg.ac.rs/handle/123456789/750
Collections
  • Radovi istraživača / Researchers' publications
Institution/Community
IHTM
TY  - JOUR
AU  - Nenadović, Miloš
AU  - Štrbac, Svetlana
AU  - Rakočević, Zlatko Lj.
PY  - 2010
UR  - https://cer.ihtm.bg.ac.rs/handle/123456789/750
AB  - In this work, the quantitative conditions for the lift height for imaging of the magnetic field using magnetic force microscopy (MFM) were optimized. A thin cobalt film deposited on a monocrystalline silicon (1 0 0) substrate with a thickness of 55 nm and a thin nickel film deposited on a glass with a thickness of 600 nm were used as samples. The topography of the surface was acquired by tapping mode atomic force microscopy (AFM), while MFM imaging was performed in the lift mode for various lift heights. It was determined that the sensitivity of the measurements was about 10% higher for images obtained at a scan angle of 90 degrees compared to a scan angle of 0 degrees. Therefore, the three-dimensional surface texture parameters, i.e., average roughness, skewness, kurtosis and the bearing ratio, were determined in dependence on the lift height for a scan angle of 90 degrees. The results of the analyses of the surface parameters showed that the influence of the substrate and its texture on the magnetic force image could be neglected for lift heights above 40 nm and that the upper lift height limit is 100 nm. It was determined that the optimal values of the lift heights were in the range from 60 to 80 nm, depending on the nature of the sample and on the type of the tip used.
PB  - Elsevier
T2  - Applied Surface Science
T1  - Quantification of the lift height for magnetic force microscopy using 3D surface parameters
VL  - 256
IS  - 6
SP  - 1652
EP  - 1656
DO  - 10.1016/j.apsusc.2009.09.088
ER  - 
@article{
author = "Nenadović, Miloš and Štrbac, Svetlana and Rakočević, Zlatko Lj.",
year = "2010",
abstract = "In this work, the quantitative conditions for the lift height for imaging of the magnetic field using magnetic force microscopy (MFM) were optimized. A thin cobalt film deposited on a monocrystalline silicon (1 0 0) substrate with a thickness of 55 nm and a thin nickel film deposited on a glass with a thickness of 600 nm were used as samples. The topography of the surface was acquired by tapping mode atomic force microscopy (AFM), while MFM imaging was performed in the lift mode for various lift heights. It was determined that the sensitivity of the measurements was about 10% higher for images obtained at a scan angle of 90 degrees compared to a scan angle of 0 degrees. Therefore, the three-dimensional surface texture parameters, i.e., average roughness, skewness, kurtosis and the bearing ratio, were determined in dependence on the lift height for a scan angle of 90 degrees. The results of the analyses of the surface parameters showed that the influence of the substrate and its texture on the magnetic force image could be neglected for lift heights above 40 nm and that the upper lift height limit is 100 nm. It was determined that the optimal values of the lift heights were in the range from 60 to 80 nm, depending on the nature of the sample and on the type of the tip used.",
publisher = "Elsevier",
journal = "Applied Surface Science",
title = "Quantification of the lift height for magnetic force microscopy using 3D surface parameters",
volume = "256",
number = "6",
pages = "1652-1656",
doi = "10.1016/j.apsusc.2009.09.088"
}
Nenadović, M., Štrbac, S.,& Rakočević, Z. Lj.. (2010). Quantification of the lift height for magnetic force microscopy using 3D surface parameters. in Applied Surface Science
Elsevier., 256(6), 1652-1656.
https://doi.org/10.1016/j.apsusc.2009.09.088
Nenadović M, Štrbac S, Rakočević ZL. Quantification of the lift height for magnetic force microscopy using 3D surface parameters. in Applied Surface Science. 2010;256(6):1652-1656.
doi:10.1016/j.apsusc.2009.09.088 .
Nenadović, Miloš, Štrbac, Svetlana, Rakočević, Zlatko Lj., "Quantification of the lift height for magnetic force microscopy using 3D surface parameters" in Applied Surface Science, 256, no. 6 (2010):1652-1656,
https://doi.org/10.1016/j.apsusc.2009.09.088 . .

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