Phase diagram investigation and characterisation of ternary Sn-In-Me (Me = Ag, Cu) lead-free solder systems
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2010
Authors
Milosavljevic, AleksandraŽivković, Dragana

Manasijević, Dragan

Talijan, Nadežda M.
Ćosović, Vladan

Grujić, Aleksandar

Marjanovic, B.
Article (Published version)

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The Sn-In-Me (Me = Ag, Cu) systems belong to the group of potential candidates for lead-free solder materials. Samples, representing two vertical sections: with In : Ag = 7: 3 from Sn-In-Ag ternary system and with Cu: In = 1:9 from Sn-In-Cu ternary system, were measured with Differential Scanning Calorimetry (DSC). The experimental transformation temperatures were compared with CALPHAD-type calculation results based on thermodynamic parameter values from COST531 database. The characterisation of investigated samples was done using Scanning Electron Microscopy with Energy Dispersive X-ray (SEM-EDX), Light Optical Microscopy (LOM), electroconductivity and microhardness measurements.
Keywords:
lead-free solders / phase diagrams / electroconductivity / Sn-In-Ag / Sn-In-CuSource:
International Journal of Materials & Product Technology, 2010, 39, 1-2, 95-107Publisher:
- Inderscience Enterprises Ltd, Geneva
DOI: 10.1504/IJMPT.2010.034263
ISSN: 0268-1900
WoS: 000281373100009
Scopus: 2-s2.0-77955193373
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IHTMTY - JOUR AU - Milosavljevic, Aleksandra AU - Živković, Dragana AU - Manasijević, Dragan AU - Talijan, Nadežda M. AU - Ćosović, Vladan AU - Grujić, Aleksandar AU - Marjanovic, B. PY - 2010 UR - https://cer.ihtm.bg.ac.rs/handle/123456789/705 AB - The Sn-In-Me (Me = Ag, Cu) systems belong to the group of potential candidates for lead-free solder materials. Samples, representing two vertical sections: with In : Ag = 7: 3 from Sn-In-Ag ternary system and with Cu: In = 1:9 from Sn-In-Cu ternary system, were measured with Differential Scanning Calorimetry (DSC). The experimental transformation temperatures were compared with CALPHAD-type calculation results based on thermodynamic parameter values from COST531 database. The characterisation of investigated samples was done using Scanning Electron Microscopy with Energy Dispersive X-ray (SEM-EDX), Light Optical Microscopy (LOM), electroconductivity and microhardness measurements. PB - Inderscience Enterprises Ltd, Geneva T2 - International Journal of Materials & Product Technology T1 - Phase diagram investigation and characterisation of ternary Sn-In-Me (Me = Ag, Cu) lead-free solder systems VL - 39 IS - 1-2 SP - 95 EP - 107 DO - 10.1504/IJMPT.2010.034263 ER -
@article{ author = "Milosavljevic, Aleksandra and Živković, Dragana and Manasijević, Dragan and Talijan, Nadežda M. and Ćosović, Vladan and Grujić, Aleksandar and Marjanovic, B.", year = "2010", abstract = "The Sn-In-Me (Me = Ag, Cu) systems belong to the group of potential candidates for lead-free solder materials. Samples, representing two vertical sections: with In : Ag = 7: 3 from Sn-In-Ag ternary system and with Cu: In = 1:9 from Sn-In-Cu ternary system, were measured with Differential Scanning Calorimetry (DSC). The experimental transformation temperatures were compared with CALPHAD-type calculation results based on thermodynamic parameter values from COST531 database. The characterisation of investigated samples was done using Scanning Electron Microscopy with Energy Dispersive X-ray (SEM-EDX), Light Optical Microscopy (LOM), electroconductivity and microhardness measurements.", publisher = "Inderscience Enterprises Ltd, Geneva", journal = "International Journal of Materials & Product Technology", title = "Phase diagram investigation and characterisation of ternary Sn-In-Me (Me = Ag, Cu) lead-free solder systems", volume = "39", number = "1-2", pages = "95-107", doi = "10.1504/IJMPT.2010.034263" }
Milosavljevic, A., Živković, D., Manasijević, D., Talijan, N. M., Ćosović, V., Grujić, A.,& Marjanovic, B.. (2010). Phase diagram investigation and characterisation of ternary Sn-In-Me (Me = Ag, Cu) lead-free solder systems. in International Journal of Materials & Product Technology Inderscience Enterprises Ltd, Geneva., 39(1-2), 95-107. https://doi.org/10.1504/IJMPT.2010.034263
Milosavljevic A, Živković D, Manasijević D, Talijan NM, Ćosović V, Grujić A, Marjanovic B. Phase diagram investigation and characterisation of ternary Sn-In-Me (Me = Ag, Cu) lead-free solder systems. in International Journal of Materials & Product Technology. 2010;39(1-2):95-107. doi:10.1504/IJMPT.2010.034263 .
Milosavljevic, Aleksandra, Živković, Dragana, Manasijević, Dragan, Talijan, Nadežda M., Ćosović, Vladan, Grujić, Aleksandar, Marjanovic, B., "Phase diagram investigation and characterisation of ternary Sn-In-Me (Me = Ag, Cu) lead-free solder systems" in International Journal of Materials & Product Technology, 39, no. 1-2 (2010):95-107, https://doi.org/10.1504/IJMPT.2010.034263 . .