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dc.creatorTodorović, D.M.
dc.creatorNikolić, P.M.
dc.creatorBojičić, A.I.
dc.creatorRadulović, K.T.
dc.date.accessioned2023-02-16T15:38:46Z
dc.date.available2023-02-16T15:38:46Z
dc.date.issued1997
dc.identifier.issn1098-0121
dc.identifier.urihttps://cer.ihtm.bg.ac.rs/handle/123456789/5708
dc.description.abstractThe photoacoustic effect is investigated as a function of the modulation frequency in a transmission detection configuration for semiconductor samples. The theoretical model for this configuration is given for the thermal and elastic processes besides the carrier-transport characteristics. The dependence of the photoacoustic effect on thermodiffusion, thermoelastic, and electronic-transport parameters is identified. The experimental photoacoustic data for Si samples are tested and they exhibit satisfactory agreement with the theoretical model.sr
dc.language.isoensr
dc.publisherThe American Physical Societysr
dc.rightsrestrictedAccesssr
dc.sourcePhys. Rev. Bsr
dc.subjectphotoacoustic effectsr
dc.subjectmodulation frequencysr
dc.subjectsemiconductorssr
dc.titleThermoelastic and electronic strain contributions to the frequency transmission photoacousticeffect in semiconductorssr
dc.typearticlesr
dc.rights.licenseARRsr
dc.citation.volume55
dc.citation.issue23
dc.citation.spage15631
dc.citation.epage15642
dc.identifier.doi10.1103/PhysRevB.55.15631
dc.identifier.scopus2-s2.0-0000454833
dc.type.versionpublishedVersionsr


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Приказ основних података о документу