PS-BBICS: Pulse stretching bulk built-in current sensor for on-chip measurement of single event transients
Аутори
Andjelković, Marko S.Marjanović, Miloš
Chen, Junchao
Ilić, Stefan
Ristić, Goran
Krstić, Miloš
Чланак у часопису (Објављена верзија)
Метаподаци
Приказ свих података о документуАпстракт
The bulk built-in current sensor (BBICS) is a cost-effective solution for detection of energetic particle strikes in integrated circuits. With an appropriate number of BBICSs distributed across the chip, the soft error locations can be identified, and the dynamic fault-tolerant mechanisms can be activated locally to correct the soft errors in the affected logic. In this work, we introduce a pulse stretching BBICS (PS-BBICS) constructed by connecting a standard BBICS and a custom-designed pulse stretching cell. The aim of PS-BBICS is to enable the on-chip measurement of the single event transient (SET) pulse width, allowing to detect the linear energy transfer (LET) of incident particles, and thus assess more accurately the radiation conditions. Based on Spectre simulations, we have shown that for the LET from 1 to 100 MeV cm2 mg−1, the SET pulse width detected by PS-BBICS varies by 620–800 ps. The threshold LET of PS-BBICS increases linearly with the number of monitored inverters, and ...it is around 1.7 MeV cm2 mg−1 for ten monitored inverters. On the other hand, the SET pulse width is independent of the number of monitored inverters for LET > 4 MeV cm2 mg−1. It was shown that supply voltage, temperature and process variations have strong impact on the response of PS-BBICS.
Кључне речи:
Bulk built-in current sensor / Single event transients / Soft errorsИзвор:
Microelectronics Reliability, 2022, 138, 114726-Издавач:
- Elsevier
Финансирање / пројекти:
- ELICSIR - Enhancement of Sceintific Excellence and Innovation Potential in Electronic Instrumentation for Ionising Radiation Environments (EU-H2020-857558)
Институција/група
IHTMTY - JOUR AU - Andjelković, Marko S. AU - Marjanović, Miloš AU - Chen, Junchao AU - Ilić, Stefan AU - Ristić, Goran AU - Krstić, Miloš PY - 2022 UR - https://cer.ihtm.bg.ac.rs/handle/123456789/5422 AB - The bulk built-in current sensor (BBICS) is a cost-effective solution for detection of energetic particle strikes in integrated circuits. With an appropriate number of BBICSs distributed across the chip, the soft error locations can be identified, and the dynamic fault-tolerant mechanisms can be activated locally to correct the soft errors in the affected logic. In this work, we introduce a pulse stretching BBICS (PS-BBICS) constructed by connecting a standard BBICS and a custom-designed pulse stretching cell. The aim of PS-BBICS is to enable the on-chip measurement of the single event transient (SET) pulse width, allowing to detect the linear energy transfer (LET) of incident particles, and thus assess more accurately the radiation conditions. Based on Spectre simulations, we have shown that for the LET from 1 to 100 MeV cm2 mg−1, the SET pulse width detected by PS-BBICS varies by 620–800 ps. The threshold LET of PS-BBICS increases linearly with the number of monitored inverters, and it is around 1.7 MeV cm2 mg−1 for ten monitored inverters. On the other hand, the SET pulse width is independent of the number of monitored inverters for LET > 4 MeV cm2 mg−1. It was shown that supply voltage, temperature and process variations have strong impact on the response of PS-BBICS. PB - Elsevier T2 - Microelectronics Reliability T1 - PS-BBICS: Pulse stretching bulk built-in current sensor for on-chip measurement of single event transients VL - 138 SP - 114726 DO - 10.1016/j.microrel.2022.114726 ER -
@article{ author = "Andjelković, Marko S. and Marjanović, Miloš and Chen, Junchao and Ilić, Stefan and Ristić, Goran and Krstić, Miloš", year = "2022", abstract = "The bulk built-in current sensor (BBICS) is a cost-effective solution for detection of energetic particle strikes in integrated circuits. With an appropriate number of BBICSs distributed across the chip, the soft error locations can be identified, and the dynamic fault-tolerant mechanisms can be activated locally to correct the soft errors in the affected logic. In this work, we introduce a pulse stretching BBICS (PS-BBICS) constructed by connecting a standard BBICS and a custom-designed pulse stretching cell. The aim of PS-BBICS is to enable the on-chip measurement of the single event transient (SET) pulse width, allowing to detect the linear energy transfer (LET) of incident particles, and thus assess more accurately the radiation conditions. Based on Spectre simulations, we have shown that for the LET from 1 to 100 MeV cm2 mg−1, the SET pulse width detected by PS-BBICS varies by 620–800 ps. The threshold LET of PS-BBICS increases linearly with the number of monitored inverters, and it is around 1.7 MeV cm2 mg−1 for ten monitored inverters. On the other hand, the SET pulse width is independent of the number of monitored inverters for LET > 4 MeV cm2 mg−1. It was shown that supply voltage, temperature and process variations have strong impact on the response of PS-BBICS.", publisher = "Elsevier", journal = "Microelectronics Reliability", title = "PS-BBICS: Pulse stretching bulk built-in current sensor for on-chip measurement of single event transients", volume = "138", pages = "114726", doi = "10.1016/j.microrel.2022.114726" }
Andjelković, M. S., Marjanović, M., Chen, J., Ilić, S., Ristić, G.,& Krstić, M.. (2022). PS-BBICS: Pulse stretching bulk built-in current sensor for on-chip measurement of single event transients. in Microelectronics Reliability Elsevier., 138, 114726. https://doi.org/10.1016/j.microrel.2022.114726
Andjelković MS, Marjanović M, Chen J, Ilić S, Ristić G, Krstić M. PS-BBICS: Pulse stretching bulk built-in current sensor for on-chip measurement of single event transients. in Microelectronics Reliability. 2022;138:114726. doi:10.1016/j.microrel.2022.114726 .
Andjelković, Marko S., Marjanović, Miloš, Chen, Junchao, Ilić, Stefan, Ristić, Goran, Krstić, Miloš, "PS-BBICS: Pulse stretching bulk built-in current sensor for on-chip measurement of single event transients" in Microelectronics Reliability, 138 (2022):114726, https://doi.org/10.1016/j.microrel.2022.114726 . .