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Complex plane analysis in electrode modulated specular reflectance studies

dc.creatorAdžić, Radoslav R.
dc.creatorCahan, B.
dc.creatorYeager, E.
dc.date.accessioned2021-06-24T14:59:35Z
dc.date.available2021-06-24T14:59:35Z
dc.date.issued1973
dc.identifier.issn0021-9606
dc.identifier.urihttps://cer.ihtm.bg.ac.rs/handle/123456789/4724
dc.description.abstractOptical specular reflection is finding extensive use for studies of electrode-electrolyte interfaces. The purpose of this Note is to call attention to the use of complex plane analysis to obtain kinetic information concerning adsorption-desorption processes from the real and imaginary components of p as functions of the ac frequency.sr
dc.language.isoensr
dc.publisherAIP Publishingsr
dc.rightsrestrictedAccesssr
dc.sourceThe Journal of Chemical Physicsr
dc.subjectelectrodesr
dc.subjectreflectancesr
dc.subjectspecularsr
dc.subjectelectrode-electrolyte interfacessr
dc.subjectelectrochemistrysr
dc.subjectcomplex plane analysissr
dc.titleComplex plane analysis in electrode modulated specular reflectance studiessr
dc.typearticlesr
dc.rights.licenseARRsr
dcterms.abstractYеагер, Е.; Цахан, Б.; Aджић, Радослав Р.;
dc.citation.volume58
dc.citation.issue4
dc.citation.spage1780
dc.citation.epage1782
dc.identifier.doi10.1063/1.1679430
dc.identifier.scopus2-s2.0-36849107088
dc.type.versionpublishedVersionsr


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