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dc.creatorRakočević, Zlatko Lj.
dc.creatorPetrovic, R.
dc.creatorŠtrbac, Svetlana
dc.date.accessioned2019-01-30T17:18:37Z
dc.date.available2019-01-30T17:18:37Z
dc.date.issued2008
dc.identifier.issn0022-2720
dc.identifier.urihttp://cer.ihtm.bg.ac.rs/handle/123456789/455
dc.description.abstractSilver was sputter deposited on a glass with a thin film thickness ranging from 10 to 80 nm. Scanning tunnelling microscopy was used to study the morphology of the obtained Ag-glass surfaces and to estimate the surface roughness. An equation for the surface roughness of the thin film was evaluated using parameters related to the thin film features: the surface roughness of the substrate, the compressibility of the thin film and the film thickness. The experimental results were fitted using the evaluated equation, and the conditions favouring lower or higher surface roughness were analyzed.en
dc.publisherWiley
dc.relationinfo:eu-repo/grantAgreement/MESTD/MPN2006-2010/141001/RS//
dc.rightsopenAccess
dc.sourceJournal of Microscopy
dc.subjectGlassen
dc.subjectScanning tunnelling microscopyen
dc.subjectSilveren
dc.subjectSputter depositionen
dc.subjectSurface roughnessen
dc.subjectUltra-thin filmsen
dc.titleSurface roughness of ultra-thin silver films sputter deposited on a glassen
dc.typearticle
dc.rights.licenseARR
dcterms.abstractШтрбац, Светлана; Петровиц, Р.; Ракочевић, Златко Љ.;
dc.citation.volume232
dc.citation.issue3
dc.citation.spage595
dc.citation.epage600
dc.citation.other232(3): 595-600
dc.citation.rankM23
dc.identifier.doi10.1111/j.1365-2818.2008.02123.x
dc.identifier.rcubConv_4174
dc.identifier.fulltexthttp://cer.ihtm.bg.ac.rs//bitstream/id/9106/453.pdf
dc.identifier.scopus2-s2.0-57449112116
dc.identifier.wos000261253200031
dc.type.versionpublishedVersion


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