Show simple item record

dc.creatorRakočević, Zlatko Lj.
dc.creatorPopović, N.
dc.creatorBogdanov, Žarko D.
dc.creatorGoncic, B.
dc.creatorŠtrbac, Svetlana
dc.date.accessioned2019-01-30T17:18:28Z
dc.date.available2008-06-03
dc.date.issued2008
dc.identifier.issn0034-6748
dc.identifier.urihttp://cer.ihtm.bg.ac.rs/handle/123456789/447
dc.description.abstractNickel was sputter deposited on a glass with a thin film thickness of 600 nm under either in an argon atmosphere or under a partial pressure of nitrogen of either 1.3× 10-4 or 4× 10-4 mbar. Atomic force microscopy and scanning surface potential microscopy (SSPM) were used to study the morphology and to estimate the surface resistivity of the obtained Ni thin films taking into account surface-roughness effects. For the three samples investigated, the surface resistivity values as estimated using SSPM were in good agreement with the results obtained by standard four-point probe measurements.en
dc.publisherAIP Publishing
dc.relationinfo:eu-repo/grantAgreement/MESTD/MPN2006-2010/141001/RS//
dc.rightsembargoedAccess
dc.sourceReview of Scientific Instruments
dc.titleSurface resistivity estimation by scanning surface potential microscopyen
dc.typearticle
dc.rights.licenseARR
dcterms.abstractРакочевић, Златко Љ.; Штрбац, Светлана; Богданов, З.; Гонциц, Б.; Поповиц, Н.;
dc.citation.volume79
dc.citation.issue6
dc.citation.other79(6):
dc.citation.rankM21
dc.identifier.doi10.1063/1.2937647
dc.identifier.rcubConv_4161
dc.identifier.fulltexthttp://cer.ihtm.bg.ac.rs/bitstream/id/14905/rakocevic2008.pdf
dc.identifier.scopus2-s2.0-46449112477
dc.identifier.wos000257283700048
dc.type.versionpublishedVersion


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record