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dc.creatorNenadović, Miloš
dc.creatorŠtrbac, Svetlana
dc.creatorRakočević, Zlatko Lj.
dc.date.accessioned2021-02-26T14:29:22Z
dc.date.available2021-02-26T14:29:22Z
dc.date.issued2008
dc.identifier.issn0373-3742
dc.identifier.urihttps://publications.aob.rs/archive.html
dc.identifier.urihttps://cer.ihtm.bg.ac.rs/handle/123456789/4270
dc.description.abstractIn this work, the optimizing conditions necessary for magnetic field gradient imaging using Atomic Force Microscopy (AFM) and Magnetic Force Microscopy (MFM) in a lift mode have been established. 55 nm thick Co thin film deposited on monocrystalline silicon substrate was used as a sample. The lift height dependence of various surface texture parameters: R-sk - the skewness, and R-ku - the kurtosis, have been determined. The results have shown that the influence of the substrate and its texture on the magnetic field gradient can be neglected for the lift height above 40 am, and that the tipper lift height limit corresponding to the height where magnetic field lines follow the shape of the field is 100 nm.en
dc.publisherBelgrade : Astronomical Observatory
dc.rightsopenAccessen
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/4.0/
dc.sourcePublications of the Astronomical Observatory of Belgrade
dc.titleSurface Texture Parameters in Optimizing Magnetic Force Imagesen
dc.typeconferenceObjecten
dc.rights.licenseBY-NC-ND
dcterms.abstractНенадовић, Милош; Ракочевић, Златко Љ.; Штрбац, Светлана;
dc.citation.issue84
dc.citation.spage197
dc.citation.epage200
dc.description.other24th summer school and international symposium on the physics of ionized gases, 25-29 August 2008, Novi Sad, Serbiaen
dc.identifier.rcubhttps://hdl.handle.net/21.15107/rcub_cer_4270
dc.identifier.fulltexthttps://cer.ihtm.bg.ac.rs/bitstream/id/19252/197-200.pdf
dc.identifier.wos000269314500051
dc.type.versionpublishedVersion


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