Local film thickness and photoresponse of thin anodic TiO2 films on polycrystalline titanium
Samo za registrovane korisnike
1989
Članak u časopisu (Objavljena verzija)

Metapodaci
Prikaz svih podataka o dokumentuApstrakt
Auger depth profiling was used to determine the local film thickness of a thin anodic oxide grown on a polycrystalline Ti substrate. The oxide thickness was studied as a function of substrate crystallography and final growth voltage. These results were related to local photocurrent measurements obtained using photoelectrochemical microscopy. Variations in the film thickness are too small to account for the non-uniform photocurrent response. The non-uniform photoresponse is instead attributed to variations in the defect density of the oxide
Ključne reči:
local film thickness / photoresponse / polycrystalline Ti substrate / oxide / photocurrent measurementsIzvor:
Electrochimica Acta, 1989, 34, 12, 1763-1768Izdavač:
- Elsevier
Institucija/grupa
IHTMTY - JOUR AU - Kozlowski, Mark R. AU - Smyrl, William H. AU - Atanasoska, Ljiljana L. AU - Atanasoski, Radoslav T. PY - 1989 UR - https://cer.ihtm.bg.ac.rs/handle/123456789/4202 AB - Auger depth profiling was used to determine the local film thickness of a thin anodic oxide grown on a polycrystalline Ti substrate. The oxide thickness was studied as a function of substrate crystallography and final growth voltage. These results were related to local photocurrent measurements obtained using photoelectrochemical microscopy. Variations in the film thickness are too small to account for the non-uniform photocurrent response. The non-uniform photoresponse is instead attributed to variations in the defect density of the oxide PB - Elsevier T2 - Electrochimica Acta T1 - Local film thickness and photoresponse of thin anodic TiO2 films on polycrystalline titanium VL - 34 IS - 12 SP - 1763 EP - 1768 DO - 10.1016/0013-4686(89)85062-5 ER -
@article{ author = "Kozlowski, Mark R. and Smyrl, William H. and Atanasoska, Ljiljana L. and Atanasoski, Radoslav T.", year = "1989", abstract = "Auger depth profiling was used to determine the local film thickness of a thin anodic oxide grown on a polycrystalline Ti substrate. The oxide thickness was studied as a function of substrate crystallography and final growth voltage. These results were related to local photocurrent measurements obtained using photoelectrochemical microscopy. Variations in the film thickness are too small to account for the non-uniform photocurrent response. The non-uniform photoresponse is instead attributed to variations in the defect density of the oxide", publisher = "Elsevier", journal = "Electrochimica Acta", title = "Local film thickness and photoresponse of thin anodic TiO2 films on polycrystalline titanium", volume = "34", number = "12", pages = "1763-1768", doi = "10.1016/0013-4686(89)85062-5" }
Kozlowski, M. R., Smyrl, W. H., Atanasoska, L. L.,& Atanasoski, R. T.. (1989). Local film thickness and photoresponse of thin anodic TiO2 films on polycrystalline titanium. in Electrochimica Acta Elsevier., 34(12), 1763-1768. https://doi.org/10.1016/0013-4686(89)85062-5
Kozlowski MR, Smyrl WH, Atanasoska LL, Atanasoski RT. Local film thickness and photoresponse of thin anodic TiO2 films on polycrystalline titanium. in Electrochimica Acta. 1989;34(12):1763-1768. doi:10.1016/0013-4686(89)85062-5 .
Kozlowski, Mark R., Smyrl, William H., Atanasoska, Ljiljana L., Atanasoski, Radoslav T., "Local film thickness and photoresponse of thin anodic TiO2 films on polycrystalline titanium" in Electrochimica Acta, 34, no. 12 (1989):1763-1768, https://doi.org/10.1016/0013-4686(89)85062-5 . .