X-Ray Analysis in the Optimization of the Sintering Process of SmCo5 Magnets

Abstract

The content of the SmCo5 phase, as the carrier of magnetic properties, was controlled by X-ray diffraction analysis. The content of the SmCo5 phase, as a function of sintering time and temperature, under constant heat treatment conditions, was observed through the intensity of its most significant diffraction peak, which corresponds to the (111) plane. By correlating these parameters with a mathematical treatment, a mutual dependence was established. A regression dependence was obtained that showed that the intensity of the diffraction peak of the (111) plane of the SmCo5 phase depends upon the squares of both the sintering time and temperature, for given heat treatment conditions. It is possible to optimize the sintering conditions by calculating values of sintering time and temperature for which this dependence has its maximum.