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dc.creatorPocuca, A.
dc.creatorBranković, Goran
dc.creatorBranković, Zorica
dc.creatorVasiljević-Radović, Dana
dc.creatorPoleti, Dejan
dc.date.accessioned2019-01-30T17:17:33Z
dc.date.available2019-01-30T17:17:33Z
dc.date.issued2008
dc.identifier.issn0272-8842
dc.identifier.urihttp://cer.ihtm.bg.ac.rs/handle/123456789/404
dc.description.abstractThe morphology of perovskite LaNiO3 (LNO) thin films is a very important feature considering the fact that they could be used as an electrode material in ferroelectric devices. In this work, LNO films were prepared from citrate precursors. The films were deposited on Si (100) and Pt covered Si substrates [Pt (111)/Ti/SiO2/Si] Using the spin-on technique. The phase composition of the films was confirmed by X-ray powder diffraction analysis, while the microstructures were investigated by atomic force microscopy. The influence of the metal ion:citric acid:ethylene glycol ratio on the morphology of the films was investigated. After optimization of these parameters, very homogenous, uniform and crack-free LNO films were obtained.en
dc.publisherElsevier Sci Ltd, Oxford
dc.rightsrestrictedAccess
dc.sourceCeramics International
dc.subjectsol-gel processesen
dc.subjectmicrostructure-finalen
dc.subjectelectrodesen
dc.titleMicrostructure of LaNiO3 thin films obtained by the spin-on technique from citrate precursorsen
dc.typearticle
dc.rights.licenseARR
dcterms.abstractБранковиц, З.; Полети, Д.; Васиљевић-Радовић, Дана; Поцуца, A.; Бранковиц, Г.;
dc.citation.volume34
dc.citation.issue2
dc.citation.spage299
dc.citation.epage303
dc.citation.other34(2): 299-303
dc.citation.rankM21
dc.identifier.doi10.1016/j.ceramint.2006.10.003
dc.identifier.rcubConv_2380
dc.identifier.scopus2-s2.0-38349156398
dc.identifier.wos000253365800009
dc.type.versionpublishedVersion


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