This paper presents results of research oriented towards developing a method for measurement of small electromagnetic forces using atomic force microscope (AFM). The method is based on the measurement of cantilever deflection due to influence of Lorentz force and enables determination of magnetic force and magnetic induction of various magnets and conductors carrying electric current. Design and fabrication of a cantilevers with "U" and "V" shape is presented. A homogenous composition of the microcantilever made of a conductive material (gold) is chosen in order to avoid the adverse bimaterial effect. Preliminary experimental results obtained by measuring interaction between a permanent magnet and current carrying cantilever are given.
Source:
26th International Conference on Microelectronics, Vols 1 and 2, Proceedings, 2008, 363-366
Publisher:
Institute of Electrical and Electronics Engineers Inc.
TY - CONF
AU - Đurić, Zoran G.
AU - Jokić, Ivana
AU - Frantlović, Miloš
AU - Randjelović, Danijela
AU - Vasiljević-Radović, Dana
AU - Smiljanić, Milče
AU - Lazić, Žarko
PY - 2008
UR - https://cer.ihtm.bg.ac.rs/handle/123456789/389
AB - This paper presents results of research oriented towards developing a method for measurement of small electromagnetic forces using atomic force microscope (AFM). The method is based on the measurement of cantilever deflection due to influence of Lorentz force and enables determination of magnetic force and magnetic induction of various magnets and conductors carrying electric current. Design and fabrication of a cantilevers with "U" and "V" shape is presented. A homogenous composition of the microcantilever made of a conductive material (gold) is chosen in order to avoid the adverse bimaterial effect. Preliminary experimental results obtained by measuring interaction between a permanent magnet and current carrying cantilever are given.
PB - Institute of Electrical and Electronics Engineers Inc.
C3 - 26th International Conference on Microelectronics, Vols 1 and 2, Proceedings
T1 - Fabrication and characterization of AFM golden microcantilevers and measurement of small electromagnetic forces
SP - 363
EP - 366
DO - 10.1109/ICMEL.2008.4559297
ER -
@conference{
author = "Đurić, Zoran G. and Jokić, Ivana and Frantlović, Miloš and Randjelović, Danijela and Vasiljević-Radović, Dana and Smiljanić, Milče and Lazić, Žarko",
year = "2008",
abstract = "This paper presents results of research oriented towards developing a method for measurement of small electromagnetic forces using atomic force microscope (AFM). The method is based on the measurement of cantilever deflection due to influence of Lorentz force and enables determination of magnetic force and magnetic induction of various magnets and conductors carrying electric current. Design and fabrication of a cantilevers with "U" and "V" shape is presented. A homogenous composition of the microcantilever made of a conductive material (gold) is chosen in order to avoid the adverse bimaterial effect. Preliminary experimental results obtained by measuring interaction between a permanent magnet and current carrying cantilever are given.",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
journal = "26th International Conference on Microelectronics, Vols 1 and 2, Proceedings",
title = "Fabrication and characterization of AFM golden microcantilevers and measurement of small electromagnetic forces",
pages = "363-366",
doi = "10.1109/ICMEL.2008.4559297"
}
Đurić, Z. G., Jokić, I., Frantlović, M., Randjelović, D., Vasiljević-Radović, D., Smiljanić, M.,& Lazić, Ž.. (2008). Fabrication and characterization of AFM golden microcantilevers and measurement of small electromagnetic forces. in 26th International Conference on Microelectronics, Vols 1 and 2, Proceedings
Institute of Electrical and Electronics Engineers Inc.., 363-366.
https://doi.org/10.1109/ICMEL.2008.4559297
Đurić ZG, Jokić I, Frantlović M, Randjelović D, Vasiljević-Radović D, Smiljanić M, Lazić Ž. Fabrication and characterization of AFM golden microcantilevers and measurement of small electromagnetic forces. in 26th International Conference on Microelectronics, Vols 1 and 2, Proceedings. 2008;:363-366.
doi:10.1109/ICMEL.2008.4559297 .
Đurić, Zoran G., Jokić, Ivana, Frantlović, Miloš, Randjelović, Danijela, Vasiljević-Radović, Dana, Smiljanić, Milče, Lazić, Žarko, "Fabrication and characterization of AFM golden microcantilevers and measurement of small electromagnetic forces" in 26th International Conference on Microelectronics, Vols 1 and 2, Proceedings (2008):363-366,
https://doi.org/10.1109/ICMEL.2008.4559297 . .
