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dc.creatorNesic, D
dc.creatorSmiljanić, Miloljub
dc.date.accessioned2019-09-10T15:24:21Z
dc.date.available2019-09-10T15:24:21Z
dc.date.issued1997
dc.identifier.issn0268-1242
dc.identifier.issn1361-6641
dc.identifier.urihttp://cer.ihtm.bg.ac.rs/handle/123456789/3084
dc.description.abstractThe work presents an analysis of an avalanche photodiode (APD) with a spherical contact surface. We calculated the dependence of the avalanche multiplication and noise parameters on the incident light wavelength. Multiplication and noise parameters are compared with the literature data for ordinary APDs at six wavelengths (500, 600, 700, 800, 850 and 900 nm). For shorter wavelengths (800 nm and below), the noise factors of the presented structure are lower or comparable with those of the best of the reach-through APD. Thus we propose using the new avalanche photodiode structure as a detector for visible light.
dc.publisherIOP Publishing
dc.rightsrestrictedAccess
dc.sourceSemiconductor Science and Technology
dc.titleCharacteristics of an avalanche photodiode with a spherical contact surface
dc.typearticleen
dc.rights.licenseARR
dcterms.abstractСмиљанић, Милољуб; Несиц, Д;
dc.rights.holderIOP Publishing Ltd
dc.citation.volume12
dc.citation.issue8
dc.citation.spage1003
dc.citation.epage1009
dc.identifier.doi10.1088/0268-1242/12/8/013
dc.identifier.scopus2-s2.0-0031212154
dc.identifier.wosA1997XQ21400012
dc.type.versionpublishedVersion


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