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dc.creatorTodorović, D. M.
dc.creatorNikolić, P. M.
dc.creatorBojičić, A.
dc.creatorSmiljanić, Miloljub
dc.creatorVasiljević-Radović, Dana
dc.creatorRadulović, Katarina
dc.date.accessioned2019-09-10T15:13:44Z
dc.date.available2019-09-10T15:13:44Z
dc.date.issued2003
dc.identifier.issn0034-6748
dc.identifier.issn1089-7623
dc.identifier.urihttp://cer.ihtm.bg.ac.rs/handle/123456789/3082
dc.description.abstractA method of investigation of semiconductors and metal–semiconductor structures based on two techniques: The elastic bending technique and pyropiezoelectric (PPE) technique was presented. The method was demonstrated on a metal–semiconductor–metal (MSM) structure, which is attached to a PPE detector. Two different ac voltages can be measured: One on the electrodes of MSM structure—the ac-photovoltage, and another on the electrodes of the PPE detector—the PPE voltage. The ac photovoltage is a consequence of the photogenerated plasma processes in the sample (MSM structure). Photogenerated plasma waves in a semiconductor are followed by the thermal and elastic waves (the elastic bending). Then, the pyroelectric voltage is a consequence of the thermal processes and the piezoelectric voltage is a consequence of elastic bending in the sample-PPE detector system. A theoretical model for a metal–semiconductor–metal-pyro(piezo)electric system is given including the space-charge regions and electronic states on the semiconductor surfaces, thermodiffusion, thermoelastic, and electronic deformation effects in a semiconductor. The photoelectric and pyropiezoelectric effects are investigated by analyzing the ac voltages as a function of the modulation frequency of excitation beam.en
dc.publisherAIP Publishingen
dc.relationMinistry of Sciences, Technologies and Development, Republic of Serbia Grant No. I.T.1.04.0062.B
dc.rightsrestrictedAccess
dc.sourceReview of Scientific Instrumentsen
dc.subjectThermal diffusivity
dc.subjectPhotoacoustic effect
dc.subjectThermal effusivity
dc.titlePhotopyropiezoelectric elastic bending methoden
dc.typeconferenceObjecten
dc.rights.licenseARR
dcterms.abstractРадуловић, К. Т.; Тодоровић, Д. М.; Смиљанић, Милољуб; Васиљевић-Радовић, Дана; Николић, П. М.; Бојичић, A.;
dc.rights.holderAmerican Institute of Physics
dc.citation.volume74
dc.citation.issue1
dc.citation.spage635
dc.citation.epage638
dc.citation.rankM21
dc.description.otherConference: 12th International Conference on Photoacoustic and Photothermal Phenomena (12 ICPPP) Location: Toronto, Canada; Date: JUN 24-27, 2002
dc.identifier.doi10.1063/1.1520317
dc.identifier.scopus2-s2.0-0037283202
dc.identifier.wos000180451900101
dc.type.versionpublishedVersion


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