Photopyropiezoelectric elastic bending method
Authorized Users Only
2003
Authors
Todorović, D. M.Nikolić, P. M.
Bojičić, A.
Smiljanić, Miloljub
Vasiljević-Radović, Dana

Radulović, Katarina

Conference object (Published version)

American Institute of Physics
Metadata
Show full item recordAbstract
A method of investigation of semiconductors and metal–semiconductor structures based on two techniques: The elastic bending technique and pyropiezoelectric (PPE) technique was presented. The method was demonstrated on a metal–semiconductor–metal (MSM) structure, which is attached to a PPE detector. Two different ac voltages can be measured: One on the electrodes of MSM structure—the ac-photovoltage, and another on the electrodes of the PPE detector—the PPE voltage. The ac photovoltage is a consequence of the photogenerated plasma processes in the sample (MSM structure). Photogenerated plasma waves in a semiconductor are followed by the thermal and elastic waves (the elastic bending). Then, the pyroelectric voltage is a consequence of the thermal processes and the piezoelectric voltage is a consequence of elastic bending in the sample-PPE detector system. A theoretical model for a metal–semiconductor–metal-pyro(piezo)electric system is given including the space-charge regions and electr...onic states on the semiconductor surfaces, thermodiffusion, thermoelastic, and electronic deformation effects in a semiconductor. The photoelectric and pyropiezoelectric effects are investigated by analyzing the ac voltages as a function of the modulation frequency of excitation beam.
Keywords:
Thermal diffusivity / Photoacoustic effect / Thermal effusivitySource:
Review of Scientific Instruments, 2003, 74, 1, 635-638Publisher:
- AIP Publishing
Projects:
- Ministry of Sciences, Technologies and Development, Republic of Serbia Grant No. I.T.1.04.0062.B
Note:
- Conference: 12th International Conference on Photoacoustic and Photothermal Phenomena (12 ICPPP) Location: Toronto, Canada; Date: JUN 24-27, 2002
DOI: 10.1063/1.1520317
ISSN: 0034-6748; 1089-7623