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Erratum to: “A simple approximative method for determination of Auger 1 lifetime in degenerate narrow gap semiconductors (Infrared Physics 34 (1993) 601-605)”
TY - JOUR
AU - Đurić, Zoran G.
AU - Jakšić, Zoran
AU - Vulanić, A.
AU - Smiljanić, Miloljub
PY - 1995
UR - https://cer.ihtm.bg.ac.rs/handle/123456789/3079
AB - An error appeared in Fig. 3 in the part regarding low electron concentrations.
PB - Elsevier
T2 - Infrared Physics & Technology
T1 - Erratum to: “A simple approximative method for determination of Auger 1 lifetime in degenerate narrow gap semiconductors (Infrared Physics 34 (1993) 601-605)”
VL - 36
IS - 4
SP - 819
DO - 10.1016/1350-4495(95)00025-T
ER -
@article{
author = "Đurić, Zoran G. and Jakšić, Zoran and Vulanić, A. and Smiljanić, Miloljub",
year = "1995",
abstract = "An error appeared in Fig. 3 in the part regarding low electron concentrations.",
publisher = "Elsevier",
journal = "Infrared Physics & Technology",
title = "Erratum to: “A simple approximative method for determination of Auger 1 lifetime in degenerate narrow gap semiconductors (Infrared Physics 34 (1993) 601-605)”",
volume = "36",
number = "4",
pages = "819",
doi = "10.1016/1350-4495(95)00025-T"
}
Đurić, Z. G., Jakšić, Z., Vulanić, A.,& Smiljanić, M.. (1995). Erratum to: “A simple approximative method for determination of Auger 1 lifetime in degenerate narrow gap semiconductors (Infrared Physics 34 (1993) 601-605)”. in Infrared Physics & Technology
Elsevier., 36(4), 819.
https://doi.org/10.1016/1350-4495(95)00025-T
Đurić ZG, Jakšić Z, Vulanić A, Smiljanić M. Erratum to: “A simple approximative method for determination of Auger 1 lifetime in degenerate narrow gap semiconductors (Infrared Physics 34 (1993) 601-605)”. in Infrared Physics & Technology. 1995;36(4):819.
doi:10.1016/1350-4495(95)00025-T .
Đurić, Zoran G., Jakšić, Zoran, Vulanić, A., Smiljanić, Miloljub, "Erratum to: “A simple approximative method for determination of Auger 1 lifetime in degenerate narrow gap semiconductors (Infrared Physics 34 (1993) 601-605)”" in Infrared Physics & Technology, 36, no. 4 (1995):819,
https://doi.org/10.1016/1350-4495(95)00025-T . .
,