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dc.creatorTripković, Amalija
dc.creatorPopović, Ksenija
dc.creatorStevanović, Rade M.
dc.creatorSocha, R.
dc.creatorKowal, Andrzej
dc.date.accessioned2019-05-22T09:09:36Z
dc.date.available2019-05-22T09:09:36Z
dc.date.issued2006
dc.identifier.issn1388-2481
dc.identifier.urihttps://cer.ihtm.bg.ac.rs/handle/123456789/2879
dc.description.abstractFormic acid oxidation in acid solution was examined on a PtBi alloy characterized by X-ray photoelectron spectroscopy. Three chemical states of Bi, i.e., PtBi or Bi(0), Bi2O3 and BiO(OH) were found. Electrochemical characterization revealed that PtBi follows the behavior of its constituents, as well as that Bi is not stable in the PtBi alloy. It was established that the activity of PtBi is highly dependent of the reduction/oxidation of Bi species. Oxidation of formic acid does not occur on Bi covered PtBi. Rotated PtBi showed impressive activity relative to polycrystalline Pt, with the onset potential shifted by 0.25 V towards more negative potentials, and attained steady state current densities at 0.05 V, higher by two and half orders of magnitude. The activity of PtBi is caused by UPD phenomena of Bi on Pt, which was electrochemically detected. In addition, based on XPS analysis, it is proposed that the activity of PtBi could also be caused by the bifunctional action of hydroxylated Bi species.en
dc.language.isoensr
dc.publisherElseviersr
dc.relationinfo:eu-repo/grantAgreement/MESTD/MPN2006-2010/142056/RS//sr
dc.rightsrestrictedAccesssr
dc.sourceElectrochemistry Communicationsr
dc.subjectFormic acidsr
dc.subjectElectrochemical oxidationsr
dc.subjectPt–Bi alloysr
dc.subjectBi UPDsr
dc.subjectXPS characterizationsr
dc.subjectFuel cellssr
dc.titleActivity of a PtBi alloy in the electrochemical oxidation of formic aciden
dc.typearticlesr
dc.rights.licenseARRsr
dcterms.abstractПоповић, Ксенија Ђ.; Трипковић, Aмалија В.; Коwал, Aндрзеј; Соцха, Р.; Стевановић, Р.М.;
dc.citation.volume8
dc.citation.issue9
dc.citation.spage1492
dc.citation.epage1498
dc.citation.rankM21
dc.identifier.doi10.1016/j.elecom.2006.07.005
dc.identifier.scopus2-s2.0-33748446082
dc.identifier.wos000240796300015
dc.type.versionpublishedVersionsr


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