Electrodes, assigned as GC/Pt-C and GC/Pt-Ru-C, were formed by deposition of Pt-based catalysts (47.5 wt % Pt + high surface area carbon) and (54 wt. % Pt-Ru alloy + high surface area carbon) on glassy carbon (GC) discs. X-ray diffraction measurements were used for the determination of the average crystallite size and phase composition of both catalysts. Crystallite size for Pt-C catalyst was 2.9 nm for Pt-fcc. In the diffraction pattern of the Pt-Ru-C catalyst two phases, e.g. Pt-Ru-fcc and Ru-hcp were refined using the Rietveld method. Crystallite sizes were 3.9 nm for Pt-Ru-fcc and 2.8 nm for Ru-hcp. STM observations of the surface of GC/Pt-C and GC/Pt-Ru-C electrodes revealed the presence of metal particles of the size in the range 2-6 nm and Pt-C or PtRu-C agglomerates in the range of several tenth of nm. The thickness of the Nafion covering layer determined by AFM is ca. 100 nm. A simplified scheme of the investigated electrodes was created.
TY - CONF
AU - Kowal, Andrzej
AU - Olszewski, Piotr K.
AU - Tripković, Dušan
AU - Stevanović, Rade M.
PY - 2006
UR - http://cer.ihtm.bg.ac.rs/handle/123456789/281
AB - Electrodes, assigned as GC/Pt-C and GC/Pt-Ru-C, were formed by deposition of Pt-based catalysts (47.5 wt % Pt + high surface area carbon) and (54 wt. % Pt-Ru alloy + high surface area carbon) on glassy carbon (GC) discs. X-ray diffraction measurements were used for the determination of the average crystallite size and phase composition of both catalysts. Crystallite size for Pt-C catalyst was 2.9 nm for Pt-fcc. In the diffraction pattern of the Pt-Ru-C catalyst two phases, e.g. Pt-Ru-fcc and Ru-hcp were refined using the Rietveld method. Crystallite sizes were 3.9 nm for Pt-Ru-fcc and 2.8 nm for Ru-hcp. STM observations of the surface of GC/Pt-C and GC/Pt-Ru-C electrodes revealed the presence of metal particles of the size in the range 2-6 nm and Pt-C or PtRu-C agglomerates in the range of several tenth of nm. The thickness of the Nafion covering layer determined by AFM is ca. 100 nm. A simplified scheme of the investigated electrodes was created.
C3 - Materials Science Forum
T1 - Nanoscale topography of GC/Pt-C and GC/Pt-Ru-C electrodes studied by means of STM, AFM and XRD methods
VL - 518
SP - 271
EP - 276
DO - 10.4028/www.scientific.net/MSF.518.271
ER -
@conference{
author = "Kowal, Andrzej and Olszewski, Piotr K. and Tripković, Dušan and Stevanović, Rade M.",
year = "2006",
url = "http://cer.ihtm.bg.ac.rs/handle/123456789/281",
abstract = "Electrodes, assigned as GC/Pt-C and GC/Pt-Ru-C, were formed by deposition of Pt-based catalysts (47.5 wt % Pt + high surface area carbon) and (54 wt. % Pt-Ru alloy + high surface area carbon) on glassy carbon (GC) discs. X-ray diffraction measurements were used for the determination of the average crystallite size and phase composition of both catalysts. Crystallite size for Pt-C catalyst was 2.9 nm for Pt-fcc. In the diffraction pattern of the Pt-Ru-C catalyst two phases, e.g. Pt-Ru-fcc and Ru-hcp were refined using the Rietveld method. Crystallite sizes were 3.9 nm for Pt-Ru-fcc and 2.8 nm for Ru-hcp. STM observations of the surface of GC/Pt-C and GC/Pt-Ru-C electrodes revealed the presence of metal particles of the size in the range 2-6 nm and Pt-C or PtRu-C agglomerates in the range of several tenth of nm. The thickness of the Nafion covering layer determined by AFM is ca. 100 nm. A simplified scheme of the investigated electrodes was created.",
journal = "Materials Science Forum",
title = "Nanoscale topography of GC/Pt-C and GC/Pt-Ru-C electrodes studied by means of STM, AFM and XRD methods",
volume = "518",
pages = "271-276",
doi = "10.4028/www.scientific.net/MSF.518.271"
}
Kowal, A., Olszewski, P. K., Tripković, D.,& Stevanović, R. M. (2006). Nanoscale topography of GC/Pt-C and GC/Pt-Ru-C electrodes studied by means of STM, AFM and XRD methods.
Materials Science Forum, 518, 271-276.
https://doi.org/10.4028/www.scientific.net/MSF.518.271
Kowal A, Olszewski PK, Tripković D, Stevanović RM. Nanoscale topography of GC/Pt-C and GC/Pt-Ru-C electrodes studied by means of STM, AFM and XRD methods. Materials Science Forum. 2006;518:271-276
Kowal Andrzej, Olszewski Piotr K., Tripković Dušan, Stevanović Rade M., "Nanoscale topography of GC/Pt-C and GC/Pt-Ru-C electrodes studied by means of STM, AFM and XRD methods" Materials Science Forum, 518 (2006):271-276,
https://doi.org/10.4028/www.scientific.net/MSF.518.271 .
