The Schottky barrier contribution to photoacoustic effect in Au-Si system
Само за регистроване кориснике
2000
Аутори
Todorović, D. M.Nikolić, P.M.
Smiljanić, Miloljub
Petrović, R.
Bojicić, A.I.
Vasiljević-Radović, Dana

Radulović, Katarina

Конференцијски прилог (Објављена верзија)

Метаподаци
Приказ свих података о документуАпстракт
The photoacoustic effect in metal-semiconductor system, i.e., the influence of Schottky barrier on the thermal and electronic transport processes in semiconductor was investigated. The amplitude and phase spectra were measured for dependence on the modulation frequency of excitation optical beam, using the PA frequency transmission technique. Thermal, elastic and electronic transport parameters were obtained by the analysis of experimental and theoretical PA signals, including the Schottky barrier effect, for a metal film-semiconductor substrate sample.
Кључне речи:
Schottky barriers / Photoacoustic effects / Frequency measurement / Phase measurement / Signal analysisИзвор:
22nd International Conference on Microelectronics, MIEL 2000 - Proceedings, 2000, 1, 189-192Издавач:
- IEEE Computer Society
Институција/група
IHTMTY - CONF AU - Todorović, D. M. AU - Nikolić, P.M. AU - Smiljanić, Miloljub AU - Petrović, R. AU - Bojicić, A.I. AU - Vasiljević-Radović, Dana AU - Radulović, Katarina PY - 2000 UR - https://cer.ihtm.bg.ac.rs/handle/123456789/25 AB - The photoacoustic effect in metal-semiconductor system, i.e., the influence of Schottky barrier on the thermal and electronic transport processes in semiconductor was investigated. The amplitude and phase spectra were measured for dependence on the modulation frequency of excitation optical beam, using the PA frequency transmission technique. Thermal, elastic and electronic transport parameters were obtained by the analysis of experimental and theoretical PA signals, including the Schottky barrier effect, for a metal film-semiconductor substrate sample. PB - IEEE Computer Society C3 - 22nd International Conference on Microelectronics, MIEL 2000 - Proceedings T1 - The Schottky barrier contribution to photoacoustic effect in Au-Si system VL - 1 SP - 189 EP - 192 DO - 10.1109/ICMEL.2000.840552 ER -
@conference{ author = "Todorović, D. M. and Nikolić, P.M. and Smiljanić, Miloljub and Petrović, R. and Bojicić, A.I. and Vasiljević-Radović, Dana and Radulović, Katarina", year = "2000", abstract = "The photoacoustic effect in metal-semiconductor system, i.e., the influence of Schottky barrier on the thermal and electronic transport processes in semiconductor was investigated. The amplitude and phase spectra were measured for dependence on the modulation frequency of excitation optical beam, using the PA frequency transmission technique. Thermal, elastic and electronic transport parameters were obtained by the analysis of experimental and theoretical PA signals, including the Schottky barrier effect, for a metal film-semiconductor substrate sample.", publisher = "IEEE Computer Society", journal = "22nd International Conference on Microelectronics, MIEL 2000 - Proceedings", title = "The Schottky barrier contribution to photoacoustic effect in Au-Si system", volume = "1", pages = "189-192", doi = "10.1109/ICMEL.2000.840552" }
Todorović, D. M., Nikolić, P.M., Smiljanić, M., Petrović, R., Bojicić, A.I., Vasiljević-Radović, D.,& Radulović, K.. (2000). The Schottky barrier contribution to photoacoustic effect in Au-Si system. in 22nd International Conference on Microelectronics, MIEL 2000 - Proceedings IEEE Computer Society., 1, 189-192. https://doi.org/10.1109/ICMEL.2000.840552
Todorović DM, Nikolić P, Smiljanić M, Petrović R, Bojicić A, Vasiljević-Radović D, Radulović K. The Schottky barrier contribution to photoacoustic effect in Au-Si system. in 22nd International Conference on Microelectronics, MIEL 2000 - Proceedings. 2000;1:189-192. doi:10.1109/ICMEL.2000.840552 .
Todorović, D. M., Nikolić, P.M., Smiljanić, Miloljub, Petrović, R., Bojicić, A.I., Vasiljević-Radović, Dana, Radulović, Katarina, "The Schottky barrier contribution to photoacoustic effect in Au-Si system" in 22nd International Conference on Microelectronics, MIEL 2000 - Proceedings, 1 (2000):189-192, https://doi.org/10.1109/ICMEL.2000.840552 . .