IR bimaterial detectors performance
Само за регистроване кориснике
2006
Конференцијски прилог (Објављена верзија)
Метаподаци
Приказ свих података о документуАпстракт
In this paper basic parameters of a bimaterial infrared thermal detector (BMD) - sensitivity, noise equivalent power, detectivity - and their dependence on relevant thermal and mechanical parameters are given. In order to find sensitivity and noise we introduce an equivalent "thermo mechanical" excitation force for microelctromechanical bimaterial oscillator and solved equation for this oscillator assuming only first mode of vibration. After the identification of all important noise mechanisms (temperature fluctuations, Brownian motion), we solved the appropriate Langevin stochastic equation and obtained the mean square deflection of the bimaterial cantilever oscillator. This enabled us to determine all of the important parameters for BMD.
Извор:
25th International Conference on Microelectronics, MIEL 2006 - Proceedings, 2006, 241-Издавач:
- Institute of Electrical and Electronics Engineers Inc.
DOI: 10.1109/ICMEL.2006.1650937
ISSN: 2159-1660
WoS: 000238839700044
Scopus: 2-s2.0-77956537122
Институција/група
IHTMTY - CONF AU - Đurić, Zoran G. AU - Randjelović, Danijela AU - Matovic, J. AU - Lamovec, Jelena PY - 2006 UR - https://cer.ihtm.bg.ac.rs/handle/123456789/244 AB - In this paper basic parameters of a bimaterial infrared thermal detector (BMD) - sensitivity, noise equivalent power, detectivity - and their dependence on relevant thermal and mechanical parameters are given. In order to find sensitivity and noise we introduce an equivalent "thermo mechanical" excitation force for microelctromechanical bimaterial oscillator and solved equation for this oscillator assuming only first mode of vibration. After the identification of all important noise mechanisms (temperature fluctuations, Brownian motion), we solved the appropriate Langevin stochastic equation and obtained the mean square deflection of the bimaterial cantilever oscillator. This enabled us to determine all of the important parameters for BMD. PB - Institute of Electrical and Electronics Engineers Inc. C3 - 25th International Conference on Microelectronics, MIEL 2006 - Proceedings T1 - IR bimaterial detectors performance SP - 241 DO - 10.1109/ICMEL.2006.1650937 ER -
@conference{ author = "Đurić, Zoran G. and Randjelović, Danijela and Matovic, J. and Lamovec, Jelena", year = "2006", abstract = "In this paper basic parameters of a bimaterial infrared thermal detector (BMD) - sensitivity, noise equivalent power, detectivity - and their dependence on relevant thermal and mechanical parameters are given. In order to find sensitivity and noise we introduce an equivalent "thermo mechanical" excitation force for microelctromechanical bimaterial oscillator and solved equation for this oscillator assuming only first mode of vibration. After the identification of all important noise mechanisms (temperature fluctuations, Brownian motion), we solved the appropriate Langevin stochastic equation and obtained the mean square deflection of the bimaterial cantilever oscillator. This enabled us to determine all of the important parameters for BMD.", publisher = "Institute of Electrical and Electronics Engineers Inc.", journal = "25th International Conference on Microelectronics, MIEL 2006 - Proceedings", title = "IR bimaterial detectors performance", pages = "241", doi = "10.1109/ICMEL.2006.1650937" }
Đurić, Z. G., Randjelović, D., Matovic, J.,& Lamovec, J.. (2006). IR bimaterial detectors performance. in 25th International Conference on Microelectronics, MIEL 2006 - Proceedings Institute of Electrical and Electronics Engineers Inc.., 241. https://doi.org/10.1109/ICMEL.2006.1650937
Đurić ZG, Randjelović D, Matovic J, Lamovec J. IR bimaterial detectors performance. in 25th International Conference on Microelectronics, MIEL 2006 - Proceedings. 2006;:241. doi:10.1109/ICMEL.2006.1650937 .
Đurić, Zoran G., Randjelović, Danijela, Matovic, J., Lamovec, Jelena, "IR bimaterial detectors performance" in 25th International Conference on Microelectronics, MIEL 2006 - Proceedings (2006):241, https://doi.org/10.1109/ICMEL.2006.1650937 . .