We considered theoretically and experimentally one-dimensional multilayered metallodielectric nanofilms with nanometric thickness for imaging below the diffraction limit. We investigated their behavior in the ultravioled and visible spectrum from the point of view of near field optics, but also considered some of their properties in the far field. We designed our structures using the transfer matrix method and utilized RF sputtering to fabricate them. We consider some possible approaches to extract optical information from such multilavers.
TY - CONF
AU - Jakšić, Zoran
AU - Sarajlić, Milija
AU - Maksimović, Milan
AU - Vasiljević-Radović, Dana
AU - Jovanović, Dušan M.
PY - 2006
UR - https://cer.ihtm.bg.ac.rs/handle/123456789/243
AB - We considered theoretically and experimentally one-dimensional multilayered metallodielectric nanofilms with nanometric thickness for imaging below the diffraction limit. We investigated their behavior in the ultravioled and visible spectrum from the point of view of near field optics, but also considered some of their properties in the far field. We designed our structures using the transfer matrix method and utilized RF sputtering to fabricate them. We consider some possible approaches to extract optical information from such multilavers.
PB - Institute of Electrical and Electronics Engineers Inc.
C3 - 25th International Conference on Microelectronics, MIEL 2006 - Proceedings
T1 - A consideration of transparent metal structures for subwavelength diffraction management
SP - 153
DO - 10.1109/ICMEL.2006.1650917
ER -
@conference{
author = "Jakšić, Zoran and Sarajlić, Milija and Maksimović, Milan and Vasiljević-Radović, Dana and Jovanović, Dušan M.",
year = "2006",
abstract = "We considered theoretically and experimentally one-dimensional multilayered metallodielectric nanofilms with nanometric thickness for imaging below the diffraction limit. We investigated their behavior in the ultravioled and visible spectrum from the point of view of near field optics, but also considered some of their properties in the far field. We designed our structures using the transfer matrix method and utilized RF sputtering to fabricate them. We consider some possible approaches to extract optical information from such multilavers.",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
journal = "25th International Conference on Microelectronics, MIEL 2006 - Proceedings",
title = "A consideration of transparent metal structures for subwavelength diffraction management",
pages = "153",
doi = "10.1109/ICMEL.2006.1650917"
}
Jakšić, Z., Sarajlić, M., Maksimović, M., Vasiljević-Radović, D.,& Jovanović, D. M.. (2006). A consideration of transparent metal structures for subwavelength diffraction management. in 25th International Conference on Microelectronics, MIEL 2006 - Proceedings
Institute of Electrical and Electronics Engineers Inc.., 153.
https://doi.org/10.1109/ICMEL.2006.1650917
Jakšić Z, Sarajlić M, Maksimović M, Vasiljević-Radović D, Jovanović DM. A consideration of transparent metal structures for subwavelength diffraction management. in 25th International Conference on Microelectronics, MIEL 2006 - Proceedings. 2006;:153.
doi:10.1109/ICMEL.2006.1650917 .
Jakšić, Zoran, Sarajlić, Milija, Maksimović, Milan, Vasiljević-Radović, Dana, Jovanović, Dušan M., "A consideration of transparent metal structures for subwavelength diffraction management" in 25th International Conference on Microelectronics, MIEL 2006 - Proceedings (2006):153,
https://doi.org/10.1109/ICMEL.2006.1650917 . .
