Permittivity Characterization Using a Double-Sided Parallel-Strip Line Resonator

dc.creator	Nešić, Dušan
dc.creator	Radnovic, I.
dc.date.accessioned	2019-01-30T17:59:39Z
dc.date.available	2019-01-30T17:59:39Z
dc.date.issued	2018
dc.identifier.uri	https://cer.ihtm.bg.ac.rs/handle/123456789/2397
dc.description.abstract	The paper introduces the new type of a microwave permittivity sensor with an open stub realized as a double-sided parallel-strip line without substrate. It can be totally immersed into the measured material and obtains high sensitivity of the resonant frequency nearly proportional to ratio of square roots of the dielectric constants of the measured materials.	en
dc.publisher	Institute of Electrical and Electronics Engineers Inc.
dc.relation	info:eu-repo/grantAgreement/MESTD/Technological Development (TD or TR)/32008/RS//
dc.rights	restrictedAccess
dc.source	Proceedings of the International Semiconductor Conference, CAS
dc.subject	Double-sided parallel-strip line	en
dc.subject	Microstrip	en
dc.subject	Microwave sensor	en
dc.subject	Permittivity measurement	en
dc.title	Permittivity Characterization Using a Double-Sided Parallel-Strip Line Resonator	en
dc.type	conferenceObject
dc.rights.license	ARR
dcterms.abstract	Радновиц, И.; Нешић, Душан;
dc.citation.spage	109
dc.citation.epage	112
dc.citation.other	: 109-112
dc.identifier.doi	10.1109/SMICND.2018.8539801
dc.identifier.scopus	2-s2.0-85059646775
dc.type.version	publishedVersion