Prikaz osnovnih podataka o dokumentu

dc.creatorPremović, Milena
dc.creatorTomović, Milica
dc.creatorMinić, Duško
dc.creatorManasijević, Dragan
dc.creatorŽivković, Dragana
dc.creatorĆosović, Vladan
dc.creatorGrkovic, Vladan
dc.creatorĐorđevic, Aleksandar
dc.date.accessioned2019-01-30T17:56:15Z
dc.date.available2019-01-30T17:56:15Z
dc.date.issued2017
dc.identifier.issn1059-9495
dc.identifier.urihttps://cer.ihtm.bg.ac.rs/handle/123456789/2239
dc.description.abstractTernary Al-Ag-Ga system at 200 degrees C was experimentally and thermodynamically assessed. Isothermal section was extrapolated using optimized thermodynamic parameters for constitutive binary systems. Microstructure and phase composition of the selected alloy samples were analyzed using light microscopy, scanning electron microscopy combined with energy-dispersive spectrometry and x-ray powder diffraction technique. The obtained experimental results were found to be in a close agreement with the predicted phase equilibria. Hardness and electrical conductivity of the alloy samples from four vertical sections Al-Ag80Ga20, Al-Ag60Ga40, Ag-Al80Ga20 and Ag-Al60Ga40 of the ternary Al-Ag-Ga system at 200 degrees C were experimentally determined using Brinell method and eddy current measurements. Additionally, hardness of the individual phases present in the microstructure of the studied alloy samples was determined using Vickers microhardness test. Based on experimentally obtained results, isolines of Brinell hardness and electrical conductivity were calculated for the alloys from isothermal section of the ternary Al-Ag-Ga system at 200 degrees C.en
dc.publisherSpringer, New York
dc.relationinfo:eu-repo/grantAgreement/MESTD/Basic Research (BR or ON)/172037/RS//
dc.rightsrestrictedAccess
dc.sourceJournal of Materials Engineering and Performance
dc.subjectelectrical propertiesen
dc.subjecthardnessen
dc.subjectisothermal section at 200 degrees Cen
dc.subjectmicrostructureen
dc.subjectXRDen
dc.titleDetermination of 200 degrees C Isothermal Section of Al-Ag-Ga Phase Diagram by Microanalysis, X-ray Diffraction, Hardness and Electrical Conductivity Measurementsen
dc.typearticle
dc.rights.licenseARR
dc.citation.volume26
dc.citation.issue6
dc.citation.spage2491
dc.citation.epage2501
dc.citation.other26(6): 2491-2501
dc.citation.rankM23
dc.identifier.doi10.1007/s11665-017-2689-4
dc.identifier.scopus2-s2.0-85018843991
dc.identifier.wos000402734000006
dc.type.versionpublishedVersion


Dokumenti

Thumbnail

Ovaj dokument se pojavljuje u sledećim kolekcijama

Prikaz osnovnih podataka o dokumentu