Show simple item record

dc.creatorGomidzelovic, Lidija
dc.creatorŽivković, Dragana
dc.creatorPozega, Emina
dc.creatorĆosović, Vladan
dc.creatorBalanović, Ljubiša
dc.creatorManasijević, Dragan
dc.date.accessioned2019-01-30T17:45:21Z
dc.date.available2019-01-30T17:45:21Z
dc.date.issued2015
dc.identifier.issn0025-5300
dc.identifier.urihttp://cer.ihtm.bg.ac.rs/handle/123456789/1712
dc.description.abstractIn this publication, results are presented which have been obtained by investigation of mechanical and electrical properties of alloys belonging to Sb-Ga50Au10In40 section of quaternary Au-Ga-In-Sb system, which is the basis for the development of new lead-free solder materials. The experiments were conducted using Brinell method for hardness measurement, apparatus PTM-3 for microhardness measurement and instrument Foerster SIGMATEST 2.069 for measuring of electrical conductivity. The microstructure of samples was analyzed using optical microscopy.en
dc.publisherCarl Hanser Verlag, Munich
dc.relationinfo:eu-repo/grantAgreement/MESTD/Technological Development (TD or TR)/34005/RS//
dc.relationinfo:eu-repo/grantAgreement/MESTD/Basic Research (BR or ON)/172037/RS//
dc.rightsrestrictedAccess
dc.sourceMaterials Testing
dc.subjectSb-Ga50Au10In40en
dc.subjectmicrostructureen
dc.subjecthardnessen
dc.subjectmicrohardnessen
dc.subjectelectrical conductivityen
dc.titleMechanical and electrical properties of Sb-Ga50Au10In40 alloysen
dc.typearticle
dc.rights.licenseARR
dcterms.abstractЋосовић, Владан; Зивковиц, Драгана; Манасијевиц, Драган; Балановић, Љубиша; Позега, Емина; Гомидзеловиц, Лидија;
dc.citation.volume57
dc.citation.issue9
dc.citation.spage807
dc.citation.epage810
dc.citation.other57(9): 807-810
dc.citation.rankM23
dc.identifier.doi10.3139/120.110780
dc.identifier.rcubConv_3399
dc.identifier.scopus2-s2.0-84941950120
dc.identifier.wos000360735200014
dc.type.versionpublishedVersion


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record