In this publication, results are presented which have been obtained by investigation of mechanical and electrical properties of alloys belonging to Sb-Ga50Au10In40 section of quaternary Au-Ga-In-Sb system, which is the basis for the development of new lead-free solder materials. The experiments were conducted using Brinell method for hardness measurement, apparatus PTM-3 for microhardness measurement and instrument Foerster SIGMATEST 2.069 for measuring of electrical conductivity. The microstructure of samples was analyzed using optical microscopy.
TY - JOUR
AU - Gomidzelovic, Lidija
AU - Živković, Dragana
AU - Pozega, Emina
AU - Ćosović, Vladan
AU - Balanović, Ljubiša
AU - Manasijević, Dragan
PY - 2015
UR - https://cer.ihtm.bg.ac.rs/handle/123456789/1712
AB - In this publication, results are presented which have been obtained by investigation of mechanical and electrical properties of alloys belonging to Sb-Ga50Au10In40 section of quaternary Au-Ga-In-Sb system, which is the basis for the development of new lead-free solder materials. The experiments were conducted using Brinell method for hardness measurement, apparatus PTM-3 for microhardness measurement and instrument Foerster SIGMATEST 2.069 for measuring of electrical conductivity. The microstructure of samples was analyzed using optical microscopy.
PB - Carl Hanser Verlag, Munich
T2 - Materials Testing
T1 - Mechanical and electrical properties of Sb-Ga50Au10In40 alloys
VL - 57
IS - 9
SP - 807
EP - 810
DO - 10.3139/120.110780
ER -
@article{
author = "Gomidzelovic, Lidija and Živković, Dragana and Pozega, Emina and Ćosović, Vladan and Balanović, Ljubiša and Manasijević, Dragan",
year = "2015",
abstract = "In this publication, results are presented which have been obtained by investigation of mechanical and electrical properties of alloys belonging to Sb-Ga50Au10In40 section of quaternary Au-Ga-In-Sb system, which is the basis for the development of new lead-free solder materials. The experiments were conducted using Brinell method for hardness measurement, apparatus PTM-3 for microhardness measurement and instrument Foerster SIGMATEST 2.069 for measuring of electrical conductivity. The microstructure of samples was analyzed using optical microscopy.",
publisher = "Carl Hanser Verlag, Munich",
journal = "Materials Testing",
title = "Mechanical and electrical properties of Sb-Ga50Au10In40 alloys",
volume = "57",
number = "9",
pages = "807-810",
doi = "10.3139/120.110780"
}
Gomidzelovic, L., Živković, D., Pozega, E., Ćosović, V., Balanović, L.,& Manasijević, D.. (2015). Mechanical and electrical properties of Sb-Ga50Au10In40 alloys. in Materials Testing
Carl Hanser Verlag, Munich., 57(9), 807-810.
https://doi.org/10.3139/120.110780
Gomidzelovic L, Živković D, Pozega E, Ćosović V, Balanović L, Manasijević D. Mechanical and electrical properties of Sb-Ga50Au10In40 alloys. in Materials Testing. 2015;57(9):807-810.
doi:10.3139/120.110780 .
Gomidzelovic, Lidija, Živković, Dragana, Pozega, Emina, Ćosović, Vladan, Balanović, Ljubiša, Manasijević, Dragan, "Mechanical and electrical properties of Sb-Ga50Au10In40 alloys" in Materials Testing, 57, no. 9 (2015):807-810,
https://doi.org/10.3139/120.110780 . .
