TY  - JOUR
AU  - Nikolić, Pantelija M.
AU  - Šćepanović, Dragan
AU  - Todorović, Dragan M.
AU  - Vasiljević-Radović, Dana
AU  - Radulović, Katarina
AU  - Đurić, Stevan
AU  - Urošević, Dragan
AU  - Blagojević, Vladimir
AU  - Mihajlović, Pene
AU  - Petrović, Radomir
PY  - 2001
UR  - https://cer.ihtm.bg.ac.rs/handle/123456789/5776
AB  - Anisotropy in the thermal properties in α SiO2 single crystals SC cut mode 1 and mode 2 was investigated using the photoacosutic (PA) frequency transmission technique. The PA amplitude and phase diagrams were measured and numerically analyzed. The obtained results for the thermal diffusivity for SC mod1 was 0.34×10-5 m2/s while it was 0.40×10-5 m2/s for mode 2. The differences in PA spectra for both SC cuts were larger compared with much smaller differences which were observed using infrared reflectivity spectra.
PB  - The Japan Society for Analytical Chemistry
T2  - Analytical Sciences
T1  - Anisotropy in Thermal Properties of Single Crystal α Quartz Obtained by the Photoacoustic Method
VL  - 17
SP  - s151
EP  - s153
DO  - 10.14891/analscisp.17icpp.0.s151.0
ER  - 

@article{
author = "Nikolić, Pantelija M. and Šćepanović, Dragan and Todorović, Dragan M. and Vasiljević-Radović, Dana and Radulović, Katarina and Đurić, Stevan and Urošević, Dragan and Blagojević, Vladimir and Mihajlović, Pene and Petrović, Radomir",
year = "2001",
abstract = "Anisotropy in the thermal properties in α SiO2 single crystals SC cut mode 1 and mode 2 was investigated using the photoacosutic (PA) frequency transmission technique. The PA amplitude and phase diagrams were measured and numerically analyzed. The obtained results for the thermal diffusivity for SC mod1 was 0.34×10-5 m2/s while it was 0.40×10-5 m2/s for mode 2. The differences in PA spectra for both SC cuts were larger compared with much smaller differences which were observed using infrared reflectivity spectra.",
publisher = "The Japan Society for Analytical Chemistry",
journal = "Analytical Sciences",
title = "Anisotropy in Thermal Properties of Single Crystal α Quartz Obtained by the Photoacoustic Method",
volume = "17",
pages = "s151-s153",
doi = "10.14891/analscisp.17icpp.0.s151.0"
}

Nikolić, P. M., Šćepanović, D., Todorović, D. M., Vasiljević-Radović, D., Radulović, K., Đurić, S., Urošević, D., Blagojević, V., Mihajlović, P.,& Petrović, R.. (2001). Anisotropy in Thermal Properties of Single Crystal α Quartz Obtained by the Photoacoustic Method. in Analytical Sciences
The Japan Society for Analytical Chemistry., 17, s151-s153.
https://doi.org/10.14891/analscisp.17icpp.0.s151.0

Nikolić PM, Šćepanović D, Todorović DM, Vasiljević-Radović D, Radulović K, Đurić S, Urošević D, Blagojević V, Mihajlović P, Petrović R. Anisotropy in Thermal Properties of Single Crystal α Quartz Obtained by the Photoacoustic Method. in Analytical Sciences. 2001;17:s151-s153.
doi:10.14891/analscisp.17icpp.0.s151.0 .

Nikolić, Pantelija M., Šćepanović, Dragan, Todorović, Dragan M., Vasiljević-Radović, Dana, Radulović, Katarina, Đurić, Stevan, Urošević, Dragan, Blagojević, Vladimir, Mihajlović, Pene, Petrović, Radomir, "Anisotropy in Thermal Properties of Single Crystal α Quartz Obtained by the Photoacoustic Method" in Analytical Sciences, 17 (2001):s151-s153,
https://doi.org/10.14891/analscisp.17icpp.0.s151.0 . .

TY  - CONF
AU  - Jakšić, Zoran
AU  - Petrović, Radomir
AU  - Randjelović, Danijela
AU  - Danković, Tatjana
AU  - Đurić, Zoran
AU  - Ehrfeld, Wolfgang
AU  - Schmidt, Andreas
AU  - Hecker, Klaus
PY  - 1999
UR  - https://cer.ihtm.bg.ac.rs/handle/123456789/6864
AB  - Abstract
We propose a single-chip multicolor photodetector for (3-5) μm range based on a linear IR semiconductor detector array with an integrated 1-D photonic bandgap (PBG) filter. A wedge-shaped defect slab (corresponding to a Fizeau-type interferometer) is introduced into the filter instead of one of the layers. The bandgap of the photonic crystal coincides with the spectral sensitivity range of the photodetector array, while the built-in defect gives a transmission peak within the same range. The defect thickness varies along the array length and thus shifts the transmission peak wavelength. The optimized photonic bandgap filter including defect is designed using the transfer matrix method. The peak frequency is tuned by choosing the geometrical parameters of the wedge-shaped defect. In our experiments, thin alternating Si and SiO2 films are sputtered onto the array surface, thus forming a 1-D PBG structure. The defect is fabricated by gradually changing the middle Si layer thickness over the width of the array. Its wedge-forming is performed by micromachining or, alternatively, by in-situ oblique deposition within the sputtering system and, possibly, subsequent chemomechanical polishing. The characteristics of the finished PBG structure are measured using an IR spectrophotometer. An increase of the number of PBG layers improves the confinement of transmission peaks and thus decreases the crosstalk between the array elements. Although our multicolor detector is designed for the (3-5) μm atmospheric window, it can be straightforwardly redesigned for any other optical range.
PB  - Society of Photo-Optical Instrumentation Engineers (SPIE)
C3  - Proceedings of SPIE - The International Society for Optical Engineering, Proceedings of the 1999 Design, Test, and Microfabrication of MEMS and MOEMS
T1  - Integrated multicolor detector utilizing 1-D photonic bandgap filter with wedge-shaped defect
VL  - 3680
IS  - II
SP  - 611
EP  - 619
DO  - 10.1117/12.341252
ER  - 

@conference{
author = "Jakšić, Zoran and Petrović, Radomir and Randjelović, Danijela and Danković, Tatjana and Đurić, Zoran and Ehrfeld, Wolfgang and Schmidt, Andreas and Hecker, Klaus",
year = "1999",
abstract = "Abstract
We propose a single-chip multicolor photodetector for (3-5) μm range based on a linear IR semiconductor detector array with an integrated 1-D photonic bandgap (PBG) filter. A wedge-shaped defect slab (corresponding to a Fizeau-type interferometer) is introduced into the filter instead of one of the layers. The bandgap of the photonic crystal coincides with the spectral sensitivity range of the photodetector array, while the built-in defect gives a transmission peak within the same range. The defect thickness varies along the array length and thus shifts the transmission peak wavelength. The optimized photonic bandgap filter including defect is designed using the transfer matrix method. The peak frequency is tuned by choosing the geometrical parameters of the wedge-shaped defect. In our experiments, thin alternating Si and SiO2 films are sputtered onto the array surface, thus forming a 1-D PBG structure. The defect is fabricated by gradually changing the middle Si layer thickness over the width of the array. Its wedge-forming is performed by micromachining or, alternatively, by in-situ oblique deposition within the sputtering system and, possibly, subsequent chemomechanical polishing. The characteristics of the finished PBG structure are measured using an IR spectrophotometer. An increase of the number of PBG layers improves the confinement of transmission peaks and thus decreases the crosstalk between the array elements. Although our multicolor detector is designed for the (3-5) μm atmospheric window, it can be straightforwardly redesigned for any other optical range.",
publisher = "Society of Photo-Optical Instrumentation Engineers (SPIE)",
journal = "Proceedings of SPIE - The International Society for Optical Engineering, Proceedings of the 1999 Design, Test, and Microfabrication of MEMS and MOEMS",
title = "Integrated multicolor detector utilizing 1-D photonic bandgap filter with wedge-shaped defect",
volume = "3680",
number = "II",
pages = "611-619",
doi = "10.1117/12.341252"
}

Jakšić, Z., Petrović, R., Randjelović, D., Danković, T., Đurić, Z., Ehrfeld, W., Schmidt, A.,& Hecker, K.. (1999). Integrated multicolor detector utilizing 1-D photonic bandgap filter with wedge-shaped defect. in Proceedings of SPIE - The International Society for Optical Engineering, Proceedings of the 1999 Design, Test, and Microfabrication of MEMS and MOEMS
Society of Photo-Optical Instrumentation Engineers (SPIE)., 3680(II), 611-619.
https://doi.org/10.1117/12.341252

Jakšić Z, Petrović R, Randjelović D, Danković T, Đurić Z, Ehrfeld W, Schmidt A, Hecker K. Integrated multicolor detector utilizing 1-D photonic bandgap filter with wedge-shaped defect. in Proceedings of SPIE - The International Society for Optical Engineering, Proceedings of the 1999 Design, Test, and Microfabrication of MEMS and MOEMS. 1999;3680(II):611-619.
doi:10.1117/12.341252 .

Jakšić, Zoran, Petrović, Radomir, Randjelović, Danijela, Danković, Tatjana, Đurić, Zoran, Ehrfeld, Wolfgang, Schmidt, Andreas, Hecker, Klaus, "Integrated multicolor detector utilizing 1-D photonic bandgap filter with wedge-shaped defect" in Proceedings of SPIE - The International Society for Optical Engineering, Proceedings of the 1999 Design, Test, and Microfabrication of MEMS and MOEMS, 3680, no. II (1999):611-619,
https://doi.org/10.1117/12.341252 . .

TY  - CONF
AU  - Đurić, Zoran
AU  - Petrović, Radomir
AU  - Randjelović, Danijela
AU  - Danković, Tatjana
AU  - Jakšić, Zoran
AU  - Ehrfeld, Wolfgang
AU  - Feiertag, Georg
AU  - Freimuth, H.
PY  - 1997
UR  - https://cer.ihtm.bg.ac.rs/handle/123456789/6863
AB  - Abstract
Based on our detailed theoretical analysis we fabricated 1D Si/SiO2 photonic crystals with donor and acceptor defects. We observed their photonic band-gaps and defect modes by measuring the infrared transmission of the samples. We propose here the application of this type of structures for enhancement of InSb photodetector detectivity.
PB  - Institute of Electrical and Electronics Engineers (IEEE)
C3  - Proceedings - 21st International Conference on Microelectronics MIEL 97, 14-17 September 1997, Niš, Serbia
T1  - One dimensional Si-SiO2 photonic crystal with defects intended for use in infrared spectral region
VL  - 1
SP  - 99
EP  - 102
DO  - 10.1109/ICMEL.1997.625190
ER  - 

@conference{
author = "Đurić, Zoran and Petrović, Radomir and Randjelović, Danijela and Danković, Tatjana and Jakšić, Zoran and Ehrfeld, Wolfgang and Feiertag, Georg and Freimuth, H.",
year = "1997",
abstract = "Abstract
Based on our detailed theoretical analysis we fabricated 1D Si/SiO2 photonic crystals with donor and acceptor defects. We observed their photonic band-gaps and defect modes by measuring the infrared transmission of the samples. We propose here the application of this type of structures for enhancement of InSb photodetector detectivity.",
publisher = "Institute of Electrical and Electronics Engineers (IEEE)",
journal = "Proceedings - 21st International Conference on Microelectronics MIEL 97, 14-17 September 1997, Niš, Serbia",
title = "One dimensional Si-SiO2 photonic crystal with defects intended for use in infrared spectral region",
volume = "1",
pages = "99-102",
doi = "10.1109/ICMEL.1997.625190"
}

Đurić, Z., Petrović, R., Randjelović, D., Danković, T., Jakšić, Z., Ehrfeld, W., Feiertag, G.,& Freimuth, H.. (1997). One dimensional Si-SiO2 photonic crystal with defects intended for use in infrared spectral region. in Proceedings - 21st International Conference on Microelectronics MIEL 97, 14-17 September 1997, Niš, Serbia
Institute of Electrical and Electronics Engineers (IEEE)., 1, 99-102.
https://doi.org/10.1109/ICMEL.1997.625190

Đurić Z, Petrović R, Randjelović D, Danković T, Jakšić Z, Ehrfeld W, Feiertag G, Freimuth H. One dimensional Si-SiO2 photonic crystal with defects intended for use in infrared spectral region. in Proceedings - 21st International Conference on Microelectronics MIEL 97, 14-17 September 1997, Niš, Serbia. 1997;1:99-102.
doi:10.1109/ICMEL.1997.625190 .

Đurić, Zoran, Petrović, Radomir, Randjelović, Danijela, Danković, Tatjana, Jakšić, Zoran, Ehrfeld, Wolfgang, Feiertag, Georg, Freimuth, H., "One dimensional Si-SiO2 photonic crystal with defects intended for use in infrared spectral region" in Proceedings - 21st International Conference on Microelectronics MIEL 97, 14-17 September 1997, Niš, Serbia, 1 (1997):99-102,
https://doi.org/10.1109/ICMEL.1997.625190 . .

TY  - JOUR
AU  - Đurić, Zoran G.
AU  - Matić, Milan J.
AU  - Matović, Jovan
AU  - Petrović, Radomir
AU  - Simičić, Nevenka
PY  - 1990
UR  - https://cer.ihtm.bg.ac.rs/handle/123456789/4457
AB  - A method is presented for the accurate determination of the deflection of diaphragms commonly used for miniature piezoresistive and capacitive pressure sensors. The method utilizes a well-known apparatus for thin-film thickness measurements (Talystep), an instrument for accurate pressure measurement and control (Mensor) and a sample holder for simultaneous pressure application and diaphragm deflection measurement. The deflection measurements for a stiffened and a square diaphragm are presented and compared to analytically calculated results from the literature. High-precision deflection measurements reveal the existence of build-in stresses.
PB  - Elsevier
T2  - Sensors and Actuators: A.Physical
T1  - Experimental determination of silicon pressure sensor diaphragm deflection
VL  - 24
IS  - 3
SP  - 175
EP  - 179
DO  - 10.1016/0924-4247(90)80053-8
ER  - 

@article{
author = "Đurić, Zoran G. and Matić, Milan J. and Matović, Jovan and Petrović, Radomir and Simičić, Nevenka",
year = "1990",
abstract = "A method is presented for the accurate determination of the deflection of diaphragms commonly used for miniature piezoresistive and capacitive pressure sensors. The method utilizes a well-known apparatus for thin-film thickness measurements (Talystep), an instrument for accurate pressure measurement and control (Mensor) and a sample holder for simultaneous pressure application and diaphragm deflection measurement. The deflection measurements for a stiffened and a square diaphragm are presented and compared to analytically calculated results from the literature. High-precision deflection measurements reveal the existence of build-in stresses.",
publisher = "Elsevier",
journal = "Sensors and Actuators: A.Physical",
title = "Experimental determination of silicon pressure sensor diaphragm deflection",
volume = "24",
number = "3",
pages = "175-179",
doi = "10.1016/0924-4247(90)80053-8"
}

Đurić, Z. G., Matić, M. J., Matović, J., Petrović, R.,& Simičić, N.. (1990). Experimental determination of silicon pressure sensor diaphragm deflection. in Sensors and Actuators: A.Physical
Elsevier., 24(3), 175-179.
https://doi.org/10.1016/0924-4247(90)80053-8

Đurić ZG, Matić MJ, Matović J, Petrović R, Simičić N. Experimental determination of silicon pressure sensor diaphragm deflection. in Sensors and Actuators: A.Physical. 1990;24(3):175-179.
doi:10.1016/0924-4247(90)80053-8 .

Đurić, Zoran G., Matić, Milan J., Matović, Jovan, Petrović, Radomir, Simičić, Nevenka, "Experimental determination of silicon pressure sensor diaphragm deflection" in Sensors and Actuators: A.Physical, 24, no. 3 (1990):175-179,
https://doi.org/10.1016/0924-4247(90)80053-8 . .