Ermes, Markus

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Influence of film formation on light-trapping properties of randomly textured silicon thin-film solar cells

Jovanov, Vladislav; Shrestha, Shailesh; Hüpkes, Jürgen; Ermes, Markus; Bittkau, Karsten; Knipp, Dietmar

(The Japan Society of Applied Physics, 2014)

TY  - JOUR
AU  - Jovanov, Vladislav
AU  - Shrestha, Shailesh
AU  - Hüpkes, Jürgen
AU  - Ermes, Markus
AU  - Bittkau, Karsten
AU  - Knipp, Dietmar
PY  - 2014
UR  - https://cer.ihtm.bg.ac.rs/handle/123456789/6876
AB  - The influence of film formation on light-trapping properties of silicon thin-film solar cells prepared on randomly textured substrates was studied. Realistic interface morphologies were calculated with a three-dimensional (3D) surface coverage algorithm using the measured substrate morphology and nominal film thicknesses of the individual layers as input parameters. Calculated interface morphologies were used in finite-difference time-domain simulations to determine the quantum efficiency and absorption in the individual layers of the thin-film solar cells. The investigation shows that a realistic description of interface morphologies is required to accurately predict the light-trapping properties of randomly textured silicon thin-film solar cells.
PB  - The Japan Society of Applied Physics
T2  - Applied Physics Express
T1  - Influence of film formation on light-trapping properties of randomly textured silicon thin-film solar cells
VL  - 7
IS  - 8
SP  - 082301
DO  - 10.7567/APEX.7.082301
ER  - 
@article{
author = "Jovanov, Vladislav and Shrestha, Shailesh and Hüpkes, Jürgen and Ermes, Markus and Bittkau, Karsten and Knipp, Dietmar",
year = "2014",
abstract = "The influence of film formation on light-trapping properties of silicon thin-film solar cells prepared on randomly textured substrates was studied. Realistic interface morphologies were calculated with a three-dimensional (3D) surface coverage algorithm using the measured substrate morphology and nominal film thicknesses of the individual layers as input parameters. Calculated interface morphologies were used in finite-difference time-domain simulations to determine the quantum efficiency and absorption in the individual layers of the thin-film solar cells. The investigation shows that a realistic description of interface morphologies is required to accurately predict the light-trapping properties of randomly textured silicon thin-film solar cells.",
publisher = "The Japan Society of Applied Physics",
journal = "Applied Physics Express",
title = "Influence of film formation on light-trapping properties of randomly textured silicon thin-film solar cells",
volume = "7",
number = "8",
pages = "082301",
doi = "10.7567/APEX.7.082301"
}
Jovanov, V., Shrestha, S., Hüpkes, J., Ermes, M., Bittkau, K.,& Knipp, D.. (2014). Influence of film formation on light-trapping properties of randomly textured silicon thin-film solar cells. in Applied Physics Express
The Japan Society of Applied Physics., 7(8), 082301.
https://doi.org/10.7567/APEX.7.082301
Jovanov V, Shrestha S, Hüpkes J, Ermes M, Bittkau K, Knipp D. Influence of film formation on light-trapping properties of randomly textured silicon thin-film solar cells. in Applied Physics Express. 2014;7(8):082301.
doi:10.7567/APEX.7.082301 .
Jovanov, Vladislav, Shrestha, Shailesh, Hüpkes, Jürgen, Ermes, Markus, Bittkau, Karsten, Knipp, Dietmar, "Influence of film formation on light-trapping properties of randomly textured silicon thin-film solar cells" in Applied Physics Express, 7, no. 8 (2014):082301,
https://doi.org/10.7567/APEX.7.082301 . .
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