TY  - CONF
AU  - Nešić, Dušan
AU  - Radnovic, I.
PY  - 2018
UR  - https://cer.ihtm.bg.ac.rs/handle/123456789/2397
AB  - The paper introduces the new type of a microwave permittivity sensor with an open stub realized as a double-sided parallel-strip line without substrate. It can be totally immersed into the measured material and obtains high sensitivity of the resonant frequency nearly proportional to ratio of square roots of the dielectric constants of the measured materials.
PB  - Institute of Electrical and Electronics Engineers Inc.
C3  - Proceedings of the International Semiconductor Conference, CAS
T1  - Permittivity Characterization Using a Double-Sided Parallel-Strip Line Resonator
SP  - 109
EP  - 112
DO  - 10.1109/SMICND.2018.8539801
ER  - 

@conference{
author = "Nešić, Dušan and Radnovic, I.",
year = "2018",
abstract = "The paper introduces the new type of a microwave permittivity sensor with an open stub realized as a double-sided parallel-strip line without substrate. It can be totally immersed into the measured material and obtains high sensitivity of the resonant frequency nearly proportional to ratio of square roots of the dielectric constants of the measured materials.",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
journal = "Proceedings of the International Semiconductor Conference, CAS",
title = "Permittivity Characterization Using a Double-Sided Parallel-Strip Line Resonator",
pages = "109-112",
doi = "10.1109/SMICND.2018.8539801"
}

Nešić, D.,& Radnovic, I.. (2018). Permittivity Characterization Using a Double-Sided Parallel-Strip Line Resonator. in Proceedings of the International Semiconductor Conference, CAS
Institute of Electrical and Electronics Engineers Inc.., 109-112.
https://doi.org/10.1109/SMICND.2018.8539801

Nešić D, Radnovic I. Permittivity Characterization Using a Double-Sided Parallel-Strip Line Resonator. in Proceedings of the International Semiconductor Conference, CAS. 2018;:109-112.
doi:10.1109/SMICND.2018.8539801 .

Nešić, Dušan, Radnovic, I., "Permittivity Characterization Using a Double-Sided Parallel-Strip Line Resonator" in Proceedings of the International Semiconductor Conference, CAS (2018):109-112,
https://doi.org/10.1109/SMICND.2018.8539801 . .