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Photo-pyro-piezo-electric elastic bending method: Investigation of metalsemiconductor structure
dc.creator | Todorović, D. M. | |
dc.creator | Nikolić, P.M. | |
dc.creator | Smiljanić, Miloljub | |
dc.creator | Bojičić, A.I. | |
dc.creator | Vasiljević-Radović, Dana | |
dc.creator | Radulović, Katarina | |
dc.date.accessioned | 2019-01-30T17:10:40Z | |
dc.date.available | 2019-01-30T17:10:40Z | |
dc.date.issued | 2002 | |
dc.identifier.isbn | 0-7803-7235-2 | |
dc.identifier.uri | https://cer.ihtm.bg.ac.rs/handle/123456789/84 | |
dc.description.abstract | The metal-semiconductor (MS) junction is investigated by new method based on two techniques: the acphotovoltage and pyro-piezo-electric technique. The sample with metal-semiconductor-metal configuration was attached to the pyro(piezo)electric detector and ac-voltages can be measured. The photovoltage and pyro-piezo-electric effects are investigated as a function of the modulation frequency of excitation optical beam. A theoretical model for a metal - semiconductor - metal - pyro(piezo)electric system is given including the space-charge regions (SCR) and electronic states on the semiconductor surfaces, and thermodifussion, thermoelastic and electronic deformation effects in semiconductor. | en |
dc.publisher | IEEE Computer Society | |
dc.rights | restrictedAccess | |
dc.source | 23rd International Conference on Microelectronics, MIEL 2002 - Proceedings | |
dc.subject | Optical surface waves | |
dc.subject | Thermoelasticity | |
dc.subject | Schottky barriers | |
dc.subject | Detectors | |
dc.subject | Optical beams | |
dc.subject | Inorganic materials | |
dc.subject | Semiconductor materials | |
dc.subject | Charge carriers | |
dc.title | Photo-pyro-piezo-electric elastic bending method: Investigation of metalsemiconductor structure | en |
dc.type | conferenceObject | |
dc.rights.license | ARR | |
dcterms.abstract | Васиљевић-Радовић, Дана; Радуловић, Катарина; Николић, П.М.; Смиљанић, Милољуб; Бојичић, A.И.; Тодоровић, Д. М.; | |
dc.citation.volume | 1 | |
dc.citation.spage | 231 | |
dc.citation.epage | 234 | |
dc.citation.other | 1: 231-234 | |
dc.identifier.doi | 10.1109/MIEL.2002.1003182 | |
dc.identifier.scopus | 2-s2.0-84906665867 | |
dc.type.version | publishedVersion |