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dc.creatorNešić, Dušan
dc.creatorRadnovic, I.
dc.date.accessioned2019-01-30T17:59:39Z
dc.date.available2019-01-30T17:59:39Z
dc.date.issued2018
dc.identifier.urihttp://cer.ihtm.bg.ac.rs/handle/123456789/2397
dc.description.abstractThe paper introduces the new type of a microwave permittivity sensor with an open stub realized as a double-sided parallel-strip line without substrate. It can be totally immersed into the measured material and obtains high sensitivity of the resonant frequency nearly proportional to ratio of square roots of the dielectric constants of the measured materials.en
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.relationinfo:eu-repo/grantAgreement/MESTD/Technological Development (TD or TR)/32008/RS//
dc.rightsrestrictedAccess
dc.sourceProceedings of the International Semiconductor Conference, CAS
dc.subjectDouble-sided parallel-strip lineen
dc.subjectMicrostripen
dc.subjectMicrowave sensoren
dc.subjectPermittivity measurementen
dc.titlePermittivity Characterization Using a Double-Sided Parallel-Strip Line Resonatoren
dc.typeconferenceObject
dc.rights.licenseARR
dcterms.abstractРадновиц, И.; Нешић, Душан;
dc.citation.spage109
dc.citation.epage112
dc.citation.other: 109-112
dc.identifier.doi10.1109/SMICND.2018.8539801
dc.identifier.rcubConv_4499
dc.identifier.scopus2-s2.0-85059646775
dc.type.versionpublishedVersion


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