Permittivity Characterization Using a Double-Sided Parallel-Strip Line Resonator
Abstract
The paper introduces the new type of a microwave permittivity sensor with an open stub realized as a double-sided parallel-strip line without substrate. It can be totally immersed into the measured material and obtains high sensitivity of the resonant frequency nearly proportional to ratio of square roots of the dielectric constants of the measured materials.
Keywords:
Double-sided parallel-strip line / Microstrip / Microwave sensor / Permittivity measurementSource:
Proceedings of the International Semiconductor Conference, CAS, 2018, 109-112Publisher:
- Institute of Electrical and Electronics Engineers Inc.
Funding / projects:
- Micro- Nanosystems and Sensors for Electric Power and Process Industry and Environmental Protection (RS-32008)
Collections
Institution/Community
IHTMTY - CONF AU - Nešić, Dušan AU - Radnovic, I. PY - 2018 UR - https://cer.ihtm.bg.ac.rs/handle/123456789/2397 AB - The paper introduces the new type of a microwave permittivity sensor with an open stub realized as a double-sided parallel-strip line without substrate. It can be totally immersed into the measured material and obtains high sensitivity of the resonant frequency nearly proportional to ratio of square roots of the dielectric constants of the measured materials. PB - Institute of Electrical and Electronics Engineers Inc. C3 - Proceedings of the International Semiconductor Conference, CAS T1 - Permittivity Characterization Using a Double-Sided Parallel-Strip Line Resonator SP - 109 EP - 112 DO - 10.1109/SMICND.2018.8539801 ER -
@conference{ author = "Nešić, Dušan and Radnovic, I.", year = "2018", abstract = "The paper introduces the new type of a microwave permittivity sensor with an open stub realized as a double-sided parallel-strip line without substrate. It can be totally immersed into the measured material and obtains high sensitivity of the resonant frequency nearly proportional to ratio of square roots of the dielectric constants of the measured materials.", publisher = "Institute of Electrical and Electronics Engineers Inc.", journal = "Proceedings of the International Semiconductor Conference, CAS", title = "Permittivity Characterization Using a Double-Sided Parallel-Strip Line Resonator", pages = "109-112", doi = "10.1109/SMICND.2018.8539801" }
Nešić, D.,& Radnovic, I.. (2018). Permittivity Characterization Using a Double-Sided Parallel-Strip Line Resonator. in Proceedings of the International Semiconductor Conference, CAS Institute of Electrical and Electronics Engineers Inc.., 109-112. https://doi.org/10.1109/SMICND.2018.8539801
Nešić D, Radnovic I. Permittivity Characterization Using a Double-Sided Parallel-Strip Line Resonator. in Proceedings of the International Semiconductor Conference, CAS. 2018;:109-112. doi:10.1109/SMICND.2018.8539801 .
Nešić, Dušan, Radnovic, I., "Permittivity Characterization Using a Double-Sided Parallel-Strip Line Resonator" in Proceedings of the International Semiconductor Conference, CAS (2018):109-112, https://doi.org/10.1109/SMICND.2018.8539801 . .