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dc.creatorPotocnik, J.
dc.creatorNenadovic, Milos
dc.creatorJokic, B.
dc.creatorŠtrbac, Svetlana
dc.creatorRakočević, Zlatko Lj.
dc.date.accessioned2019-01-30T17:38:02Z
dc.date.available2019-01-30T17:38:02Z
dc.date.issued2013
dc.identifier.issn0350-820X
dc.identifier.urihttp://cer.ihtm.bg.ac.rs/handle/123456789/1361
dc.description.abstractIn this work, a columnar structure of nickel thin film has been obtained using an advanced deposition technique known as Glancing Angle Deposition. Nickel thin film was deposited on glass sample at the constant emission current of 100 mA. Glass sample was positioned 15 degrees with respect to the nickel vapor flux. The obtained nickel thin film was characterized by Force Modulation Atomic Force Microscopy and by Scanning Electron Microscopy. Analysis indicated that the formation of the columnar structure occurred at the film thickness of 1 μm, which was achieved for the deposition time of 3 hours.en
dc.description.abstractU ovom radu, stubičasta struktura tankog sloja nikla je dobijena korišćenjem napredne tehnike deponovanja pri malim uglovima. Tanki sloj nikla je deponovan na staklu, pri konstantnoj emisionoj struji koja je iznosila 100 mA. Podloga od stakla je postavljena, u odnosu na fluks pare nikla, pod uglom od 15 stepeni. Dobijeni tanki sloj nikla je karakterisan pomoću mikroskopa u polju atomskih sila i skanirajućeg elektronskog mikroskopa. Analiza ukazuje da se formiranje stubičaste strukture javlja pri debljini sloja nikla od 1 μm, a ta debljina je dobijena nakon 3 sata deponovanja.sr
dc.publisherInternational Institute for the Science of Sintering, Beograd
dc.relationinfo:eu-repo/grantAgreement/MESTD/Integrated and Interdisciplinary Research (IIR or III)/45005/RS//
dc.rightsopenAccess
dc.sourceScience of Sintering
dc.subjectglancing angle depositionen
dc.subjectforce modulation atomic force microscopyen
dc.subjectnickelen
dc.subjectcross sectionen
dc.subjectdeponovanje pri malim uglovimasr
dc.subjectmikroskop u polju atomskih silasr
dc.subjectniklsr
dc.subjectpoprečni preseksr
dc.titleStructural characterization of the nickel thin film deposited by glad techniqueen
dc.typearticle
dc.rights.licenseBY
dcterms.abstractЈокиц, Б.; Штрбац, Светлана; Потоцник, Ј.; Ракочевић, Златко Љ.; Ненадовиц, М.;
dc.citation.volume45
dc.citation.issue1
dc.citation.spage61
dc.citation.epage67
dc.citation.other45(1): 61-67
dc.citation.rankM22
dc.identifier.doi10.2298/SOS1301061P
dc.identifier.rcubConv_2964
dc.identifier.fulltexthttp://cer.ihtm.bg.ac.rs//bitstream/id/7860/1359.pdf
dc.identifier.scopus2-s2.0-84877705136
dc.identifier.wos000318150200006
dc.type.versionpublishedVersion


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